LayTec develops, manufactures and markets optical in-situ and in-line metrology systems for thin-film processes with special focus to compound semiconductor and photovoltaic applications.
Our organization is designed and committed for offering leading thin-film metrology solutions. Therefore, we closely work together with production-line end-customers, equipment manufacturers and leading research institutions for enabling advanced thin-film process analysis and control.
The ability to control a deposition process in real-time offers high benefits: anomalies are quickly identified and corrected, development cycles are accelerated, transfer and ramp up of established processes to new lines are facilitated and conditions are easily re-established after maintenance. This all adds up to greater yields and reduced costs, which, in turn, makes the global industry more effective, more productive and less consuming of energy and resources.
Based on our technology leadership in integrated metrology we are a partner to rely on for all major end customers using thin-film technologies no matter what specific thin-film equipment these customers decide to use.
EpiTT - In-Situ Sensor For Monitoring
EpiTT is a production-line optical in-situ sensor for monitoring of epitaxial growth. EpiTT features emissivity corrected wafer temperature measurements and a two wavelength reflectance measurement for optimized on-line growth analysis.
LayTec - X Link - Metrology System
The X Link metrology system evaluates EVA cross-linking within seconds, in-line and non-destructively.