Atomic force microscopy solutions for nano photonics sector - Monitoring and Testing
The longitudinal focal field of a tightly focused light via high NA (1.45 NA) objective lens is imaged via PiFM. The measured PiFM result agrees well (slight mismatch is observed due to the uncorrected nonlinearity of open-loop tip scanner) with the longitudinal field calculated from the dipole-dipole interaction between the polarized tip and the glass substrate. Scale bar: 1 micron. Image Courtesy: Ananth Tamma (PiFM image) and Fei Huang (field model), UC Irvine.
Surface plasmon polaritons (SPP) at the gold-air surface imaged via PiFM. p-polarized 809 nm laser beam is focused via 1.49 NA objective lens with a varying incident angle (controlled via a linear translation stage). Top images show the CCD images of the illumination spot.
Image Courtesy: Junghoon Jahng, UC Irvine
Topography, PiFM, and s-SNOM (at one harmonic of the dither frequency) images are acquired concurrently from a nano-antenna structure (highlighted by a dashed circle) of a heat-assisted magnetic recording head. Results at 830 nm.
Topography, MFM, and s-SNOM (at 3ω0) images are acquired concurrently from a powered heat-assisted magnetic recording head. Side-band MFM produces far superior image of the magnetic field than lift-mode MFM image. S-SNOM results are obtained at 830 nm.