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element analysis Applications

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    Analytical instruments for elemental analysis

    Elemental analysis is a generic term for a group of applications which deal with the analysis of a variety of materials (chemicals, liquids, polymers, waste material, etc.) for their elemental or isotopic properties. Typical examples of elemental analysis techniques where mass flow control plays a key role are Total Organic Carbon (TOC) or Total Organic Halides (TOX).

    By Axetris Ag based in Kaegiswil, SWITZERLAND.

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    Gas analysis & monitoring systems for water - natural sciences

    In nature, the chemical elements can be represented by more isotopes, or atoms of the same element, characterized by a different number of neutrons in the nucleus. When the proton / neutron ratio does not exceed that value likely to upset the balance of the atom, resulting in the phenomenon known as stabilization of radioactive decay, the isotope is called stable. That is, over time, will not tend to emit energy and sub-nuclear particles to gain energy stability, giving rise, at the end of the process, the daughter nucleus (a different element, characterized by stability energy).

    By ETG Risorse e Tecnologia S.r.l. based in Montiglio, ITALY.

  • Rapid Analysis of Mining Samples Using Laser Induced Breakdown Spectroscopy (LIBS)

    Laser-induced breakdown spectroscopy (LIBS) offers many attractive analytical advantages with respect to other techniques for the mining industry. LIBS can detect elements from H – Pu, which includes non-metals, such as H, N, F, and O, along with high sensitivity for lighter elements (B, Li, C, K, Ca, Mg, Al, Si, etc.)

    By Applied Spectra, Inc. based in Fremont, CALIFORNIA (USA).

  • Quantitative Analysis of Steel Using Laser Induced Breakdown Spectroscopy (LIBS)

    For steel analysis, LIBS is ideal for rapid QC (quantitative analysis and detection of contaminants) for raw materials in production, and to check the elemental composition of finished products. LIBS also offers the ability to analyze slag samples that can lead to the recovery of precious metals lost in the steel production process. Request this application note at http://appliedspectra.com/applications/application-notes.html

    By Applied Spectra, Inc. based in Fremont, CALIFORNIA (USA).

  • X-ray fluorescence XRF analysis for environmental protection and waste management

    To meet the requirements of new regulations and to protect the environment effectively, industries need techniques that enable the analysis of elements at lowest concentration levels. Bruker X-ray fluorescence (XRF) analysis is the most suitable analytical technique for handling different kinds of materials. Bruker’s XRF, ICP-MS, GC, TOF-MS, FT-IR, CBRNE products and applications help you to monitor contaminated land efficiently and quickly, to determine hazardous elements in the air and water, as well as to classify waste material and to specify products for recycling and disposal. Whether solids, sludge, filters, liquids or powders: there is a fast and simple sample preparation technique for every material type.

    By Bruker Corporation based in Billerica, MASSACHUSETTS (USA).

  • Rapid Lead (Pb) Analysis of Thin Solder Plating on Semiconductor Leadframes Using LIBS

    Read this application note to understand how powerful the J200 LIBS Instrument is for sensitive micro-analysis of electronic components and how LIBS compares with traditional elemental analysis techniques such as XRF and ICP-OES.

    By Applied Spectra, Inc. based in Fremont, CALIFORNIA (USA).

  • Analysis of Contaminated Plant Leaves Using J200 Tandem LA – LIBS Instrument

    This application note highlights how the J200 Tandem LA – LIBS Instrument from Applied Spectra provides powerful elemental imaging for toxic elements such as Pb and As in plant leaves. Request this application note at http://appliedspectra.com/applications/application-notes.html

    By Applied Spectra, Inc. based in Fremont, CALIFORNIA (USA).

  • Depth Profile Analysis of Solid State Li-Ion Battery Device by Laser Induced Breakdown Spectroscopy (LIBS)

    This technical note highlights the ability of Laser-induced breakdown spectroscopy (LIBS) to perform depth-profiling analysis of key elements that represent the chemical makeup of important Li-ion battery components. Request this application note at http://appliedspectra.com/applications/application-notes.html

    By Applied Spectra, Inc. based in Fremont, CALIFORNIA (USA).

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    Mass flow devices for analytical instrumentation

    Axetris mass flow devices are used in a variety of analytical applications: Gas Chromatography, Mass Spectrometry, Atomic Spectroscopy, Elemental Analysis, Thermal Analysis, Bioreactor and Fermentor.

    By Axetris Ag based in Kaegiswil, SWITZERLAND.

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    EDXRF spectrometers for forensics industry

    Fingerprinting all kinds of materials analyzed in forensic analysis

    Forensic scientists generally require fast and non-destructive analysis of a very wide range of materials. Often these materials are presented in very small quantity, as evidence collected from a crime scene. Using ED-XRF allows to measure a wide range of elements and concentrations: C(6)-Fm(100), without any need of sample preparations. Samples can be measured in many different formats such as powder, solid, liquid or in thin films.

    By Xenemetrix Ltd. based in Migdal Haemek, ISRAEL.

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    Measurement of naphthalene in ambient air to monitor workplace exposure limits & at remediation & Superfund sites

    The Series 8900 Naphthalene Analyzer provides direct measurement of Naphthalene in ambient air. This instrument is utilized in industrial plants to monitor workplace exposure limits and at remediation and Superfund sites. The Series 8900 Naphthalene Analyzer employs a photoionization detector (PID) as the sensing element. A dual column configuration with timed backflush to vent is used to strip off moisture and heavier hydrocarbons. A pre-cut column is used in series with the analytical column. At sample injection a fixed volume of sample is carried to the pre-cut column. Backflush is timed so that only the Naphthalene and other similar components are eluted to the analytical column. Contaminants on the pre-cut column are backflushed to vent. Naphthalene is separated from potentially interfering components on the analytical column and elute to the detector for analysis.

    By AMETEK MOCON - Baseline based in Lyons, COLORADO (USA).

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    Application package FLUXANA Slag

    The analysis of slags in the metal industry delivers important information about the production process. FLUXANA has developed a fusion slag method which allows the direct analysis of most common slags. Elements of interest and calibrated concentration ranges can be selected individually by the customer. The same application program can also be easily adapted to the analysis of different filter dusts (see CS-0023). It can for example contain all parts to perform a complete slag analysis: - Calibration set Slags prepared from CRM and primary oxides as glass beads - Calibration work performed by FLUXANA expert 3 days on site - 3x drift monitors for xrf instrument - 5x control samples for validation - Flux FLUXANA application packages include always the sample preparation method. If you combine our application packages with our sample preparation machines FLUXANA garanties the analytical performance of the package like a contract.

    By Fluxana GmbH Co. KG based in Bedburg-Hau, GERMANY.

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    Analytical and measuring instruments of chemical and petrochemical

    In the chemical field, ICP-AES is used for a broad range of analysis in order to manage trace amounts of hazardous metals in the manufacturing process, manage additive elements essential to the functionality of a product, and manage the environment of the entire factory. Therefore, it is desirable to have a robust, highly stable system able to reliably accept the injection of a broad variety of samples, regardless of the type of solvent (aqueous/organic) or the presence of matrices. It is also important to simplify processes and reduce costs, which enhances the productivity of daily quality control work.

    By Shimadzu Scientific Instruments Inc based in Columbia, MARYLAND (USA).

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    Determination of heavy metals in food

    This analytical procedure is intended for measuring the content of the elements (cadmium, lead, arsenic, tin, chromium and mercury) in the samples of food products by atomic absorption spectrometry with electrothermal atomization using an “MGA-915M” Graphite Furnace AA Spectrometer.

    The method is based on measuring resonance radiation absorption that occurs when the radiation passes through a layer of atomic vapor in the electrically heated graphite furnace of the “MGA-915M” AA spectrometer. The concentration of the elements is determined from the integrated analytical signal and is calculated using a preset calibration graph. The samples of food products are digested prior to analysis in accordance with standard methods. 

    By Lumex Instruments Group based in Mission, BRITISH COLUMBIA (CANADA).

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    Application package FLUXANA RAW Professional

    Fusion technology is ideal for analysing oxidic materials like minerals or raw materials. It performs with the highest precision possible in xrf sample preparation. However, many laboratories cannot specify exactly what material they have to analyse. Therefore FLUXANA has created a wide range oxidic application program to allow complete analysis of the unknown material. The concentration ranges and elements of interest can be adapted to customer needs. The raw professional kit e.g. can contain all parts to perform a complete raw material (oxidic materials) calibration with 21 elements for all kind of different materials: - Calibration set raw materials prepared from CRM and pure oxides as glass beads - Calibration work performed by FLUXANA expert 3 days on site - 3x drift monitors for xrf instrument - 8x control samples for validation - Flux If you combine our application packages with our sample preparation machines FLUXANA garanties the analytical performance of the package.

    By Fluxana GmbH Co. KG based in Bedburg-Hau, GERMANY.

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    Application package FLUXANA Slag-Dust

    This application package is a 'ready to go' calibration kit for xrf instruments. The analysis of slags and filter dusts in the metal industry delivers important information about the production process. FLUXANA has developed a fusion slag + filter dusts method which allows the direct analysis of most common slags and filter dusts. Elements of interest and calibrated concentration ranges can be selected individually by the customer. It can, for example, contain all parts to perform a complete slag and filter dust analysis: - Calibration set Slags and Filter Dusts prepared from CRM and primary oxides as glass beads - Calibration work performed by FLUXANA expert 3 days on site - 3x drift monitors for xrf instrument - 6x control samples for validation - Flux FLUXANA application packages include always the sample preparation method. If you combine our application packages with our sample preparation machines FLUXANA garanties the analytical performance of the package like a contract.

    By Fluxana GmbH Co. KG based in Bedburg-Hau, GERMANY.

  • Surface Science

    SIMS - for depth profiling, surface composition measurement, and elemental imaging, Hiden's SIMS Workstation provides a complete analytical facility. RGA - The Hiden quadrupole mass spectrometers provide high sensitivity detection capability for the most demanding XHV/UHV vacuum environments. The pulse ion counting detector enables measurement of both positive and negative ions through 7 continuous decades, the integral accumulation mode being used for the capture of discreet particle events. UHV Temperature Programmed desorption studies (TPD) - Hiden Analytical’s 3F/PIC mass spectrometers with pulse ion counting detection are available configured specifically for UHVTPD providing fast, wide dynamic range detection of multiple species, capturing the entire desorption event. The Hiden IDP ion desorption probe is a quadrupole mass spectrometer configured for analysis of low energy ions in electron and photon stimulated desorption studies.

    By Hiden Analytical Ltd. based in Warrington, UNITED KINGDOM.

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