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elemental analysis instrument Applications

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    Analytical instruments for elemental analysis

    Elemental analysis is a generic term for a group of applications which deal with the analysis of a variety of materials (chemicals, liquids, polymers, waste material, etc.) for their elemental or isotopic properties. Typical examples of elemental analysis techniques where mass flow control plays a key role are Total Organic Carbon (TOC) or Total Organic Halides (TOX).

    By Axetris Ag based in Kaegiswil, SWITZERLAND.

  • Analysis of Contaminated Plant Leaves Using J200 Tandem LA – LIBS Instrument

    This application note highlights how the J200 Tandem LA – LIBS Instrument from Applied Spectra provides powerful elemental imaging for toxic elements such as Pb and As in plant leaves. Request this application note at http://appliedspectra.com/applications/application-notes.html

    By Applied Spectra, Inc. (ASI) based in Fremont, CALIFORNIA (USA).

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    Mass flow devices for analytical instrumentation

    Axetris mass flow devices are used in a variety of analytical applications: Gas Chromatography, Mass Spectrometry, Atomic Spectroscopy, Elemental Analysis, Thermal Analysis, Bioreactor and Fermentor.

    By Axetris Ag based in Kaegiswil, SWITZERLAND.

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    Analytical and measuring instruments of chemical and petrochemical

    In the chemical field, ICP-AES is used for a broad range of analysis in order to manage trace amounts of hazardous metals in the manufacturing process, manage additive elements essential to the functionality of a product, and manage the environment of the entire factory. Therefore, it is desirable to have a robust, highly stable system able to reliably accept the injection of a broad variety of samples, regardless of the type of solvent (aqueous/organic) or the presence of matrices. It is also important to simplify processes and reduce costs, which enhances the productivity of daily quality control work.

    By Shimadzu Scientific Instruments Inc based in Columbia, MARYLAND (USA).

  • Rapid Lead (Pb) Analysis of Thin Solder Plating on Semiconductor Leadframes Using LIBS

    Read this application note to understand how powerful the J200 LIBS Instrument is for sensitive micro-analysis of electronic components and how LIBS compares with traditional elemental analysis techniques such as XRF and ICP-OES.

    By Applied Spectra, Inc. (ASI) based in Fremont, CALIFORNIA (USA).

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    Application package FLUXANA Slag

    This application package is a `ready to go` calibration kit for xrf instruments. The analysis of slags in the metal industry delivers important information about the production process. FLUXANA has developed a fusion slag method which allows the direct analysis of most common slags. Elements of interest and calibrated concentration ranges can be selected individually by the customer. The same application program can also be easily adapted to the analysis of different filter dusts (see CS-0023).

    By Fluxana GmbH Co. KG based in Bedburg-Hau, GERMANY.

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    Application package FLUXANA RAW Professional

    This application package is a `ready to go` calibration kit for xrf instruments. Fusion technology is ideal for analysing oxidic materials like minerals or raw materials. It performs with the highest precision possible in xrf sample preparation. However, many laboratories cannot specify exactly what material they have to analyse. Therefore FLUXANA has created a wide range oxidic application program to allow complete analysis of the unknown material. The concentration ranges and elements of interest can be adapted to customer needs.

    By Fluxana GmbH Co. KG based in Bedburg-Hau, GERMANY.

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    Application package FLUXANA Slag-Dust

    This application package is a `ready to go` calibration kit for xrf instruments. The analysis of slags and filter dusts in the metal industry delivers important information about the production process. FLUXANA has developed a fusion slag + filter dusts method which allows the direct analysis of most common slags and filter dusts. Elements of interest and calibrated concentration ranges can be selected individually by the customer.

    By Fluxana GmbH Co. KG based in Bedburg-Hau, GERMANY.

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    Measurement of naphthalene in ambient air to monitor workplace exposure limits & at remediation & Superfund sites

    The Series 8900 Naphthalene Analyzer provides direct measurement of Naphthalene in ambient air. This instrument is utilized in industrial plants to monitor workplace exposure limits and at remediation and Superfund sites. The Series 8900 Naphthalene Analyzer employs a photoionization detector (PID) as the sensing element. A dual column configuration with timed backflush to vent is used to strip off moisture and heavier hydrocarbons. A pre-cut column is used in series with the analytical column. At sample injection a fixed volume of sample is carried to the pre-cut column. Backflush is timed so that only the Naphthalene and other similar components are eluted to the analytical column. Contaminants on the pre-cut column are backflushed to vent. Naphthalene is separated from potentially interfering components on the analytical column and elute to the detector for analysis.

    By AMETEK MOCON - Baseline based in Lyons, COLORADO (USA).

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