Only show results available in Virginia? Ok

quadrupole mass spectrometer Applications

  • Residual Gas Analysis

    Residual Gas Analysis is a general term for the analysis of gas and vapour species in vacuum chambers and vacuum processes. The Hiden RGA series quadrupole mass spectrometers provide for routine, fast, wide dynamic range residual gas analysis, measuring the partial pressures of the species that are critical to vacuum quality and process requirements. Applications include: vacuum chamber leak detection vacuum quality measurement and monitoring virtual leak detection outgassing studies bakeout cycle/vacuum...

    By Hiden Analytical Ltd. based in Warrington, UNITED KINGDOM.

  • Surface Science

    SIMS - for depth profiling, surface composition measurement, and elemental imaging, Hiden's SIMS Workstation provides a complete analytical facility. RGA - The Hiden quadrupole mass spectrometers provide high sensitivity detection capability for the most demanding XHV/UHV vacuum environments. The pulse ion counting detector enables measurement of both positive and negative ions through 7 continuous decades, the integral accumulation mode being used for the capture of discreet particle events. UHV Temperature...

    By Hiden Analytical Ltd. based in Warrington, UNITED KINGDOM.

  • MBE Desposition Rate Monitoring and Control

    XBS Triple Filter Quadrupoles configured for multiple source monitoring in MBE deposition applications. The custom configured ioniser provides for high stability, high senstivity monitoring of oxides and metals from both k-cell and e-gun sources. MBE monitoring and control. Molecular Beam Studies. Multiple beam source analysis. High Performance RGA. Desorption / Outgassing studies / Bakeout cycles. Chamber / Process gas Contaminants. Hiden XBS mass spectrometers for high precision scientific, process...

    By Hiden Analytical Ltd. based in Warrington, UNITED KINGDOM.

  • End Point Detection

    Hiden Ion Milling Probe – End Point Detector The only dedicated end point determination tool for ion etch control and optimum process quality. End point Analysis. Target Impurity Determination. Quality Control / SPC. Residual Gas Analysis. Leak Detection The IMP is a differentially pumped, ruggedized secondary ion mass spectrometer for the analysis of secondary ions and neutrals from the ion mill process, featuring: High Sensitivity SIMS / MS with Pulse Ion Counting Detector. Triple filter Quadrupole,...

    By Hiden Analytical Ltd. based in Warrington, UNITED KINGDOM.

Need help finding the right suppliers? Try XPRT Sourcing. Let the XPRTs do the work for you