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stack gas analyzer Applications

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    Gas monitoring instruments and systems for stack testing according to EPA test method 320

    The United States Environmental Protection Agency (EPA) has two stack testing methods for FTIR gas analyzers. Method 320 is an FTIR method for measuring wide range of organic and inorganic pollutants. Method 321 is a specific version for measuring hydrogen chloride HCl at cement kilns producing Portland cement. These methods define a quality assurance and control processes for verifying the accuracy of the results. The requirements for analytical equipment and software are defined on 40 CFR Part 60 Appendix B Performance Specification 15. Gasmet™ Gas Analyzers and Calcmet™ software have been designed to take the requirements of the performance specification into account.

    By Gasmet Technologies Oy based in Helsinki, FINLAND.

  • Gas detection analyzers for pollution control

    Government and environmental groups are forcing industries with medium to high VOC exhausts to reduce emissions by as much as 98%. Incineration using pollution control devices such as oxidizers and flare stacks is one way to bring the exhaust emissions in line with the regulations. Capturing and reusing solvent in a solvent recovery system is another way.

    By Control Instruments Corporation based in Fairfield, NEW JERSEY (USA).

  • Integrated real-time gas analysis solution for emissions industry

    Pollutant emissions from industrial smoke stacks are a major national concern due to both health concerns and climate change. As a consequence, there are at least tens of gas analyzer manufacturers in the U.S. alone that compete in that market and have done so for years. What CIC Photonics brings to that competitive field is its expertise derived from its Combustion Efficiency Solution and its high performance IRGAS Systems. The IRGAS-CEM provides real-time and simultaneous measurements of the multitude of toxic combustion products, including CO, CO2, NOx, SOx, CH4, CxHy, H2S, etc. The EP-IRGAS-SPA is also applicable for fast time responses.

    By CIC Photonics, Inc. based in Albuquerque, NEW MEXICO (USA).

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