Accurate Determination of Film Thickness by Fast-Scanning IR

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Courtesy of Buck Scientific Inc

Semiconductor components are made primarily from surface-doped substrates of silicon, gallium arsenide, mercury-cadmium telluride, and other highly refractive metalloid materials. Special lenses and mirrors usually have a specific coating to impart some required optical property (anti-glare, UV-blocking, colorcorrection, etc).

Polymer films used in packaging and manufacturing are often made to certain thickness specifications. These films can either be pure, single-component plastics, copolymers, or multi-layer laminates. All of these products need their respective surfaces, coatings, or layers accurately measured for QC or R&D purposes, but are too thin for direct physical measurement and too difficult to measure with cross-sectional microscopy.

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