Inderscience Publishers

Characterisation of embedded nano–precipitates by X–ray diffraction imaging and small–angle X–ray scattering

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We report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X–ray diffraction imaging and small–angle X–ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X–ray diffraction imaging. Validation of the results obtained with small–angle X–ray scattering is reported.

Keywords: X–ray diffraction imaging, small–angle X–ray scattering, embedded nanoparticles, nanoprecipitates, nanotechnology, aluminium, copper

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