Inderscience Publishers

Crack detection in dielectric structures by a linear sampling approach

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In this paper, a new approach for the detection of cracks and defects inside dielectric structures is presented. The proposed algorithm is based on the Linear Sampling Method (LSM), which is a technique able to find the external shape of unknown objects starting from far-field measurements of the scattered electric field. In particular, in this contribution, the efficient No-Sampling LSM is modified to provide a reconstruction of the positions and shapes of defects located inside a known structure. This task is accomplished by inserting the Green's function of the unperturbed object into the far-field equation. The effectiveness of the approach is assessed by means of numerical simulations.

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