X-ray fluorescence analysis (XRF) is a widely applied routine method for inorganic analysis of a variety of materials; compact ED-XRF equipment with microscopic analysis capabilities (μ-XRF) is available in different forms. Raman Spectroscopy (RS) is a highly specific method of molecular analysis that has shown it self to be admirably suitable for identification of many inorganic and organic compounds. Also Raman instruments are becoming available under the form of increasingly compact apparatus. In order to combine the above-two spectroscopic methods into one compact combined XRF/Raman instruments, an irradiation/detection geometry was designed that allows to perform simultaneous XRF and Raman measurements at the same location on the surface of a sample. An illustrative example, highlitening the usefulness of the apparatus for pigment-related investigations in the cultural heritage sector is described.