AMC contamination Articles

  • Mobile Monitoring System Speeds Detection, Localization and Troubleshooting of Molecular Contamination Sources

    Abstract Decreasing the time to detect, contain and mitigate very low levels of Airborne Contamination (AMC) is becoming more critical for high tech manufacturers. Costs associated with AMC-related quality issues and yield losses are well understood, and adequate reduction of AMC is critical for clean manufacturers to stay competitve. Technical ...


    By Particle Measuring Systems

  • OLED N2 Box Monitoring Solutions

    Abstract The Flat Panel Display manufacturing industry is evolving rapidly with growth driven by mobile devices and resolution improvements. Most display manufacturers are investing in Organic Light Emitting Diode (OLED) technology which offers improvements in color fidelity, contrast and power consumption over legacy TFT-LCD platforms. Compared with TFT-LCD, the OLED process is more ...


    By Particle Measuring Systems

  • OLED N2 Box Monitoring Solutions

    Abstract The Flat Panel Display manufacturing industry is evolving rapidly with growth driven by mobile devices and resolution improvements. Most display manufacturers are investing in Organic Light Emitting Diode (OLED) technology which offers improvements in color fidelity, contrast and power consumption over legacy TFT-LCD platforms. Compared with TFT-LCD, the OLED process is more ...


    By Particle Measuring Systems

  • Calibration and Spectrum Troubleshooting: IMS Spectrum Introduction, Measurement and Calibration (Series Part 1 of 4)

    Introduction The AirSentry II AMC Analyzer detects airborne molecular contamination (AMCs) in cleanroom manufacturing environments. AMCs cause defect loss and product degradation and its reduction is critical for manufacturers to stay competitive. AMC measurement techniques must allow for accurate, reliable event detection in real-time. The AirSentry II analyzer uses Ion Mobility ...


    By Particle Measuring Systems

  • Calibration and Spectrum Troubleshooting

    Introduction Airborne molecular contamination, referred to as “AMCs”, is a common cause of defect loss and product degradation in many cleanroom manufacturing environments. Costs associated with AMC-related quality issues and yield losses are well understood, and adequate reduction of AMC is critical for clean manufacturers to stay competitive. For this reason, AMC measurement ...


    By Particle Measuring Systems

  • OLED N2 Box Monitoring Solutions: Introduction

    Most display manufacturers are investing in Organic Light Emitting Diode (OLED) technology which offers improvements in color fidelity, contrast and power consumption over legacy TFT-LCD platforms. Compared with TFT-LCD, the OLED process is more sensitive to micro contamination, including particles, electrostatic discharge (ESD), airborne molecular contamination (AMC), volatile organic compounds ...


    By Particle Measuring Systems

  • On-Line Fast Analysis of AMC from ppt to % levels in Clean Air Room

    To ensure people’s safety and a good repeatability of industrial process, near real-time risk management and the continuous monitoring are crucial. In the semiconductor fabrication process, particle control is an essential part. Clean room technology, which relies on the use of HEPA and ULPA filtration, has in the past exclusively focused on the control of micro- and nano-particles. ...


    By Chromatotec Group

  • AMC-Monitor T-1000: all-in-one analyzer for the semiconductor industry

    Real-time VOC monitoring in FOUP, fab and the clean-room environment Airborne Molecular Contamination (AMC) is more and more taking center stage in today’s semiconductor manufacturing processes. In the past the focus was on filtering particles from the ambient air in the ...


    By Ionicon Analytik Ges.m.b.H.

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