2 products found
AudioDev GmbH Products
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Thin Film Applications
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Model ETA-TCM-R - Inline Monitoring System
Based on common layer types. Contact us for more information about your specific layer structures. Based on curve fit methods. Using stack fit methods, thicknesses down to 20 nm can be measured with TCM systems for stack ...
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Model ETA-TCM-T - Inline Monitoring System
Color measurement showing transrnit-tance, current color, color coordinate trend charts and the CIE color chart. Popup window showing measurement statistics as minimum, maximum, average and standard deviation of the last x amount of ...
