Molecular Vista

Molecular Vista Industries

  • Monitoring and Testing

  • Atomic force microscopy solutions for Polymer films sector - Monitoring and Testing

    Atomic force microscopy solutions for Polymer films sector

    Identifying Components in Polymer Films via hyPIR Imaging. hyPIR (hyperspectral PiFM infrared) image consists of (n x n) pixels of PiFM spectrum. This is a hyPIRTM image (128 x 128 pixels) of 5 nm of PS homopolymer that is spin-coated onto a 2 nm thick PMMA homopolymer on top of silicon substrate. Due to the thin PS layer and its immiscibility with PMMA, PS has dewetted into nanoscale droplets. Up to three distinct region of a hyPIRTM image can be selected to average the spectra for each region. Up to three...

  • Atomic force microscopy solutions for photo-activated polymers sector - Monitoring and Testing

    Atomic force microscopy solutions for photo-activated polymers sector

    These 10 μm images (AFM topography and PiFM) are being acquired as azobenzene surface is being modified via UV light illumination over a 15-hour period. The PiFM image at 1100 cm-1 shows that as the surface roughens, the magnitude of this peak is growing smaller. At the same time, PiFM signal at 1693 cm-1 is getting stronger at some regions of the sample, especially at the lower regions of the surface features.

  • Atomic force microscopy solutions for fiber polymers sector - Monitoring and Testing

    Atomic force microscopy solutions for fiber polymers sector

    Incorporating nanocrystalline cellulose (NCC) into polyacrylonitrile (PAN) fiber changes the tensile property of PAN fiber. The goal is to identify the distribution of NCC on PAN fiber. The peaks associated with NCC are acquired by taking PiFM spectra of pure NCC sample.  The NCC peaks compared to the glass substrate are clearly identified.  These peaks are used to bring out the subtle features from the hyPIR image taken of the PAN-NCC sample.  Note that the strengths of peaks are as such:...

  • Nanoscale identification of MoS2 layers and defects sector - Monitoring and Testing

    Nanoscale identification of MoS2 layers and defects sector

    Layers in MoS2 can be identified by photoluminescence or Raman spectroscopy, both of which suffer from diffraction limit of far-field optics. Here we demonstrate that visible PiFM can detect number of layers as well as defect associated PiFM signals with exceptional sensitivity and spatial resolution. The sample below is exfoliated MoS2 film transferred onto a quartz substrate. The PiFM measurements were performed with excitation wavelength of 488...

  • Atomic force microscopy solutions for nano photonics sector - Monitoring and Testing

    Atomic force microscopy solutions for nano photonics sector

    The longitudinal focal field of a tightly focused light via high NA (1.45 NA) objective lens is imaged via PiFM. The measured PiFM result agrees well (slight mismatch is observed due to the uncorrected nonlinearity of open-loop tip scanner) with the longitudinal field calculated from the dipole-dipole interaction between the polarized tip and the glass substrate. Scale bar: 1 micron. Image Courtesy: Ananth Tamma (PiFM image) and Fei Huang (field model), UC Irvine.