North America NanoPort (FEI)

Quanta - 3D - Scanning Electron Microscope Brochure

P R O D U C T D A T AThe Quanta 3D 200i is a characterization instrument designed to examine materials, conduct failure analysis and prepare samples in an industrial or academic environment. Combining Quanta scanning electron microscope (SEM) with a high current focused ion beam (FIB), creates a versatile solution for characterizing and modifying ...