Atomic Microscopy Equipment For Monitoring And Testing Available In Ohio
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Manufactured by Nanosurf AGbased in SWITZERLAND
Nanosurf is the market leader for custom developed systems for large and heavy samples. Over the past years our team has built a substantial knowledge base developing these custom stages for various customers. Utilizing this vast body of knowledge, we have now developed a standard product for large samples up to 300 mm or heavy samples up to 45 kg. The Alphacen 300 reduces the price and the ...
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Manufactured by HORIBA Europe GmbHbased in GERMANY
Raman imaging has never been so fast! Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever. It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman ...
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Manufactured by Oxford Instruments plcbased in UNITED KINGDOM
The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The ...
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Manufactured by JPK BioAFM Business - Bruker Nano GmbHbased in GERMANY
The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes ...
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Manufactured by 3D-Micromac AGbased in GERMANY
microPREP™ 2.0 enables high-volume sample preparation of metals, semiconductors, ceramics, and compound materials for microstructure diagnostics and failure analysis. The system can be used for a variety of semiconductor sample preparation applications, including in-plane geometries and bulk samples, cross-sections, box milling for diagnostics of electrical connections and 3D chip-level ...
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Manufactured by NanoMagnetics Instrumentsbased in UNITED KINGDOM
ezAFM is our compact atomic force microscopy system. We offer two different scan head options which are 40x40x4 µm or 120x120x40 µm. This compact atomic force microscope can be integrated with inverted light microscopes or can be used in gloveboxes. The footprint of the controller is only 15×15 cm. The samples can be moved manually or we can supply the optional motorized or ...
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Manufactured by Nanosurf AGbased in SWITZERLAND
Based on our expertise designing industrial metrology systems, Nanosurf developed the Alphacen 200 Drive – an advanced AFM system engineered to meet the high demands of the semiconductor industry. From unparalleled low-noise roughness analysis using WaveMode to complex electrical characterization tasks with SMM, the Alphacen 200 Drive solves the challenges typically faced by semiconductor ...
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Manufactured by NanoMagnetics Instrumentsbased in UNITED KINGDOM
With the help of a micron-sized semiconductor Hall sensor probe, our LT-SHPM enables user to map the surface Hall voltage V H as a function of position, which directly gives the spatial distribution of the local magnetic ...
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Distributed by Green Earth Nano Science, Inc. (GENS)based in CANADA
Nanotechnology refers broadly to a field of applied science and technology. whose unifying theme is the control of matter on the molecular level in scales. smaller than 1 micrometer, normally 1 to 100 nanometers, and the fabrication. of devices within that size range.. It is a highly multidisciplinary field, drawing from fields such as applied. physics, materials science, colloidal science, ...
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Manufactured by NanoMagnetics Instrumentsbased in UNITED KINGDOM
The LT-AFM/MFM is an alignment-free Atomic Force Microscopy system equipped with a Fibre Interferometer operating at 1310 nm, 15 fm/√Hz noise level with an operation range of 20mK-300K, and up to 16T magnetic field. The alignment-free design creates an user friendly utilization; the Fibre Interferometer carries the light by means of a fibre cable with respect to the end of the cantilever, ...
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Manufactured by WITec GmbHbased in GERMANY
alpha300 RA – Combination of Chemical and Nanoscale Structural Imaging in one System. The well-established Raman-AFM combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations for correlative Raman-AFM microscopy. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R ...
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Manufactured by Nanosurf AGbased in SWITZERLAND
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM. The result is an AFM that can easily be attached to one of Nanosurf’s large, custom-built motorized ...
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Manufactured by NanoMagnetics Instrumentsbased in UNITED KINGDOM
The new fiber Fabry-Pérot interferometer integrated to our low temperature atomic force/magnetic force microscope (LT-AFM/MFM) is operating in the 4–300 K temperature range. A multilayer dielectric mirror coated optical fiber is used to achieve unprecedented 1 fm/√Hz noise level, while the shot noise limit is 0.51 fm/√Hz. The cavity length is adjustable, and the fiber can ...
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Manufactured by Nanosurf AGbased in SWITZERLAND
The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with ...
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Manufactured by Norcada Inc.based in CANADA
NORCADA SiNx membranes offer robust X-Ray and electron transparent sample holders for nanocharacterization and microscopy. The SiNx MEMS devices come with nanometer-thickness membranes tailored to a flexible and optically flat film, and a ridgid silicon support frame. All SiNx membranes are individually inspected to meet Norcada’s high cleanliness and quality standards before cleanroom ...
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Manufactured by JPK BioAFM Business - Bruker Nano GmbHbased in GERMANY
The NanoWizard 4 XP BioScience atomic force microscope combines atomic resolution and fast scanning with rates of up to 150 lines/sec and a large scan range of 100µm in one system. It is designed to provide highest mechanical and thermal stability on inverted optical microscopes during long term experiments on samples ranging from single molecules to living cells and ...
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Manufactured by WITec GmbHbased in GERMANY
access is a micro-Raman single-spot analysis and mapping microscope. It was specifically engineered for budget-conscious customers with high demands on instrument performance. Its outstanding spectral quality, optical throughput and signal sensitivity are ensured by well-established WITec optical elements. The high-quality microscope setup of the access is also the basis for its full ...
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Manufactured by Bruker Corporationbased in USA
The new benchmark for speed with highest resolution and performance: The Dimension FastScan delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating ...
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Manufactured by JPK BioAFM Business - Bruker Nano GmbHbased in GERMANY
The JPK NanoWizard® V combines high spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters opens new possibilities for long-term, self-regulating experiment series. ...
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Manufactured by JPK BioAFM Business - Bruker Nano GmbHbased in GERMANY
The Dimension FastScan Bio Atomic Force Microscope (AFM) enables high-resolution research of biological dynamics, with temporal resolution of up to 3 frames-per-second for live sample observations. What’s more, it does this while making the AFM easier to use than ever before. Built upon the world’s most advanced large-sample AFM platform, the FastScan Bio AFM adds specialized ...
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