material analysis Equipment in Connecticut

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FischerScope XAN - Model 315 - X-ray Fluorescence (XRF) Measuring Instrument

by Fischer Technology, Inc.     based in Windsor, CONNECTICUT (USA)

Cost-effective and compact entry-level X-Ray Fluorescence (XRF) Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys

FischerScope XAN - Model 220 - X-RAY Fluorescence Measuring (XRF) Instruments

by Fischer Technology, Inc.     based in Windsor, CONNECTICUT (USA)

X-ray fluorescence measuring instrument for fast and non-destructive analysis of gold and silver alloys.

FISCHERSCOPE XUL - X-RAY Fluorescence Measuring (XRF) Instruments

by Fischer Technology, Inc.     based in Windsor, CONNECTICUT (USA)

Robust Entry-Level X-RAY Fluorescence Measuring (XRF) Instruments for Non-Destructive Material Analysis and Coating Thickness Measurement

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