Scanning Microscopes Equipment For Monitoring And Testing Available In Maine
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Manufactured by Luxor Techbased in BELGIUM
The LUXORPt is a highly innovative, fully automated sputtering device which applies a fine grain platinum or gold coating from 1 to 100 nm thickness. LUXOR’s unique A² technology assures that the gold or platinum is sprayed in a highly controlled and precise manner, resulting in an extremely uniform, thin and homogeneous coating. This allows your scanning electron microscope to ...
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Manufactured by PreciPointbased in GERMANY
Precipoint’s M8 serves as a dual microscope and scanner, with all functions accessible via a touchscreen computer – making it a true digital microscope. Our intuitive software makes it easy to navigate through your microscope slides with just the touch of your fingers. Since everything is automated and digitized, there is no need for eyepieces or manual focus knobs. Work with ...
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Manufactured by LabTech, Inc.based in USA
LabTech offers a complete line of recirculating water chillers to match all laboratory needs. Combining operational excellence and technology expertise with an intimate understanding of customer's need, LabTech offers a complete line of recirculating water chillers with CE marks. These state-of-the-art water chillers ensure accurate and constant cooling conditions for instrumentation in the harsh ...
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Manufactured by Nanosurf AGbased in SWITZERLAND
The NaioSTM is a scanning tunneling microscope that brings together scan head and controller in a single instrument for even simpler installation, maximized ease of use, and straightforward transportability. Achieve atomic resolution in minutes. The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, ...
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Manufactured by Jeol USA Incbased in USA
The JSM-6510 series SEMs are high-performance, low cost, scanning electron microscopes for fast characterization on a wide variety of sample types. Offered in both high vacuum and low vacuum models, this SEM is widely-used in all research fields and industrial ...
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Manufactured by Chinainstru & Quantumtech (Hefei) Co.,Ltd.based in CHINA
SEM3200 is a high-performance, versatile tungsten filament scanning electron microscope. With excellent imaging quality, compatible with low vacuum mode, can obtain high resolution images in different field of view. Large depth of field, imaging rich three-dimensional sense. Rich expandability helps you explore the world of microscopic ...
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based in SOUTH KOREA
a full-size floor model Scanning Electron Microscope (SEM) that both new and experienced users will find suitable for many type of demanding research and quality control requirements. The standard supplied configuration of the CX-200plus includes both SE and BSE imaging detectors as well as an internal chamber view camera for easy stage tilt and height adjustments. The CX-200plus offers high ...
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Manufactured by Jeol USA Incbased in USA
The JSM-6390 is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings. The JSM-6390 specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto ...
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Manufactured by Thermo Fisher Scientific - Materials Science Electron Microscopybased in NETHERLANDS
The sixth-generation of Thermo Scientific Phenom Pro G6 Desktop SEM fills the gap between light microscopy and floor-model SEM analysis, thus expanding the capabilities of research facilities. Its unique design makes it suitable for use in a wide variety of applications and markets. With custom made detection hardware, a high brightness source and a state of the art color navigation camera, it is ...
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Manufactured by Accurion GmbHbased in GERMANY
With the halcyonics_nano series, Accurion introduced a new product philosophy in 2008: Combination of the highest performance in active vibration isolation with the smallest dimensions at an excellent cost-performance ratio. This technology even allows active vibration isolation for entry level scanning probe ...
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Manufactured by NanoMagnetics Instrumentsbased in UNITED KINGDOM
LT-SNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM. A sample is illuminated optically by introducing a laser beam through specially designed optical fiber. The detected optical signal is transmitted via a fiber tip to a spectrometer. A topographic image can be obtained simultaneously with an optical ...
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Manufactured by NanoMagnetics Instrumentsbased in UNITED KINGDOM
hpAFM is an advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimize the time to get best results. Whether you can work in liquid or in air conditions, it is for everyone from material science to life science. hpAFM offers excellent features such as alignment-free design, closed loop flexure scanner, decoupled z ...
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Manufactured by WITec GmbHbased in GERMANY
The alpha300 S is a user-friendly Scanning Near-field Optical Microscope (SNOM) that combines the advantages of SNOM, confocal microscopy and AFM (Atomic Force Microscopy) in a single instrument. Switching between the different modes can be easily done by rotating the objective turret. The alpha300 S uses unique micro-fabricated SNOM cantilever sensors for optical microscopy with spatial ...
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Manufactured by Accurion GmbHbased in GERMANY
The compact dimensions and flexible application options of this product series make it ideal for OEM installations. It has been designed for the isolation of mid to large scale instruments and customer-specific applications. There are virtually no limits when it comes to the range of uses offered by Vario ...
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Manufactured by abberior Instruments GmbHbased in GERMANY
The INFINITY platform is the most customizable platform for all things microscopy. Whether it’s STED and confocal microscopy, intravital microscopy, material science or optical trapping, the INFINITY is always up to the challenge. Just tell us what you need and we will build you a customized, continuously upgradable system specialized for your ...
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Manufactured by ULTRAPAVE Corporationbased in USA
Performance, from an economic point of view, has been one driving force toward improving asphalt and paving technology. Finding an environmentally friendly solution has become a significant objective. These two factors have encouraged the development of polymeric treatment. ...
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based in USA
The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) delivers unmatched capabilities for large-volume 3D characterization, gallium-free sample preparation and precise micromachining and is part of the fifth generation of the industry-leading Helios DualBeam family. It combines the new PFIB column and the monochromated Thermo ...
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based in USA
PFIB SEM for in-line metrology and process monitoring of advanced 3D NAND and DRAM devices. The Thermo Scientific Helios 5 PXL Wafer DualBeam is a plasma focused ion beam scanning electron microscope (PFIB SEM) that redefines the standard for high-aspect-ratio through-stack metrology and structural verification. It features high-performance in-line metrology and process monitoring to quickly ...
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based in GERMANY
The GRIMM 5561 electrostatic precipitator is a sampler for aerosols over a wide size range from 0.8 – 1100 nm. The particles can be collected for off-line analysis on different substrates that are suitable for a variety of common analytical tools like transmission electron microscopes (TEM), scanning electron microscopes (SEM) or atomic force microscopes (AFM). For sampling well defined ...
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Manufactured by attocube systems AGbased in GERMANY
The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperature, and in high magnetic fields. The instrument works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical interferometer. This deflection detection technique has the advantage that it comes with a ...
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