Acquisition Strengthens Bruker’s Product Line for Advanced Node Metrology

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Source: Bruker Corporation

BILLERICA, Massachusetts -- Bruker Corporation today announced the closing of its acquisition of Jordan Valley Semiconductors Ltd., a major provider of X-ray metrology and defect-detection equipment for semiconductor process control. The addition of Jordan Valley’s innovative in-line X-ray metrology to Bruker’s existing X-ray metrology technologies will position the Bruker Semiconductor Division as the leading X-ray metrology system provider for semiconductor applications at advanced nodes.

“The more demanding nano-metrology requirements of ever smaller features and three-dimensional structures are being driven by increasing demand in data processing, cloud computing and mobile technologies,” said David V. Rossi, President of the Bruker Semiconductor Division. “The combination of Jordan Valley’s core metrology strengths with Bruker’s complementary X-ray technologies gives us a greater range of capabilities to best support the rapid development and production challenges facing our customers. We are committed to continuing the Jordan Valley history of success with superior X-ray solutions for advanced semiconductor metrology.”

“For the past twenty years, Jordan Valley has provided leading non-destructive X-ray metrology products and services to the world’s top semiconductor manufacturers,” added Isaac Mazor, Founder and CEO of Jordan Valley Semiconductors, and now Vice President and General Manager of Bruker’s X-ray Semiconductor business. “We are excited by the access to Bruker’s increased global market reach and resources, and we look forward to delivering innovative metrology systems that will enable semiconductor manufacturers to meet the industry’s technology roadmap.”

Financial details of the transaction were not disclosed. The acquired business is expected to add approximately $25-$30 million to Bruker’s 2016 revenue, and approximately one to two cents to Bruker’s 2016 EPS.

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