AMD Analysis & Technology AG

- Model 402 / 403 - Resolution Mass Spectrometer

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Double-focusing analyzer system in BE-configuration on anti-vibration platform, fully laminated magnet with approx. 40 cm deflection radius, electric sector field with high energy dispersion. Electrically operated entrance and exit slits. Post accelerating system (up to ± 15 kV) including SEM. Vacuum system including 3 turbo-molecular pumps for ion source and analyzer region and safety circuitry.

IONIZATION AND HYPHENATED TECHNIQUES
High intensity EI/CI standard ion source
API (ESI/APCI), DCI/DEI, Liquid SIMS and FI/FD
GC/MS, LC/MS

SAMPLE INTRODUCTION
Direct Insertion Probe, DCI Probe, High Temperature DEI Probe and customized systems including robot control for fully automated analyses

PERFORMANCE SPECIFICATIONS

RESOLUTION
> 25 000 (10% valley definition)

MASS RANGE
2000 dalton at 8 kV accelerating voltage
4000 dalton at 4 kV accelerating voltage

SENSITVITY
> 2 x 10-7 C/μg for the molecular peak of methyl stearate at 1000 resolution (10% valley definition)

INSTRUMENT CONTROL AND DATA SYSTEM
PC based (Microsoft-Windows) Multi-Tasking Instrument- Control-System (MICS) and data system for simultaneous acquisition, display and evaluation of data.

Software control of ion sources and all system parameters, scan functions, sample introduction systems and other peripheral units

Low resolution and high resolution magnetic and electric scan modes including Linked Scans, MIKES and selected ion monitoring techniques

All common data evaluation methodologies including Accurate Mass Matching, Atomic Composition Determination, Quantitation and Library Search

Special system automation hardware and software modules

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