SEM Microscope Equipment Available In Latin America
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based in USA
prevent widespread adoption. We set out to resolve these challenges in order to make a truly accessible SEM without compromising on flexibility. Our goal was to make microscopy an easy and enjoyable experience in which you should not have to fight the microscope to obtain quality data. The result is the Thermo Scientific™ Axia ...
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based in USA
PFIB SEM for in-line metrology and process monitoring of advanced 3D NAND and DRAM devices. The Thermo Scientific Helios 5 PXL Wafer DualBeam is a plasma focused ion beam scanning electron microscope (PFIB SEM) that redefines the standard for high-aspect-ratio through-stack metrology and structural verification. It features ...
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Manufactured by Chinainstru & Quantumtech (Hefei) Co.,Ltd.based in CHINA
SEM3200 is a high-performance, versatile tungsten filament scanning electron microscope. With excellent imaging quality, compatible with low vacuum mode, can obtain high resolution images in different field of view. Large depth of field, imaging rich three-dimensional sense. Rich expandability helps you explore the world of microscopic ...
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Manufactured by Jeol USA Incbased in USA
The JSM-6510 series SEMs are high-performance, low cost, scanning electron microscopes for fast characterization on a wide variety of sample types. Offered in both high vacuum and low vacuum models, this SEM is widely-used in all research fields and industrial ...
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Manufactured by Jeol USA Incbased in USA
The JSM-6390 is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings. The JSM-6390 specimen chamber can accommodate a specimen of up to 6-inches in ...
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Manufactured by M2 Polymer Technologies, Inc.based in USA
spherical particles that -- when viewed under an SEM microscope -- contain a myriad of channels. These channels provide a large particulate void volume and a means by which water and large molecules can be rapidly ...
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Manufactured by Alemnisbased in SWITZERLAND
The Alemnis Standard Assembly (ASA) comes with a custom flange and mounting adapter for installation in any Scanning Electron Microscope (SEM) with a large-enough ...
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based in SOUTH KOREA
a full-size floor model Scanning Electron Microscope (SEM) that both new and experienced users will find suitable for many type of demanding research and quality control requirements. The standard supplied configuration of the CX-200plus includes both SE and BSE imaging detectors as well as an internal chamber view camera for easy stage ...
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based in GERMANY
The GRIMM 5561 electrostatic precipitator is a sampler for aerosols over a wide size range from 0.8 – 1100 nm. The particles can be collected for off-line analysis on different substrates that are suitable for a variety of common analytical tools like transmission electron microscopes (TEM), scanning electron microscopes (SEM) or ...
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Manufactured by Kleindiek Nanotechnik GmbHbased in GERMANY
Over the last few years, the MM3A-EM micromanipulator has created an unparalleled new dimension of quality in the field of Electron Microscopy. It is employed in a wide spectrum of SEM, FIB and other microscopes for an even wider range of applications and it has become the industry standard for OEM and retrofit solutions with well over 2000 ...
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based in SOUTH KOREA
Optional product STEM is an analysis tool used to generate transmission images, on the basis of a table-top ‘Scanning Electron Microscope’ (SEM), by detecting electrons that had been projected onto a specimen in a two-dimensional manner through electron beams generated by an electron gun. This tool allows scholars in the ...
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Manufactured by Thermo Fisher Scientific - Materials Science Electron Microscopybased in NETHERLANDS
Gunshot Residue (GSR) analysis plays an important role in the determination if a firearm has been used in a crime. Established GSR analysis techniques are based on the use of a scanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles. If a suspect particle is found, an Energy Dispersive Spectroscopy ...
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Manufactured by Thermo Fisher Scientific - Materials Science Electron Microscopybased in NETHERLANDS
The Phenom Pure desktop scanning electron microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is the most economical solution for high-resolution imaging, providing the best imaging results in its class. The Phenom Pure provides high-quality images while using basic features, and offers the ...
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Manufactured by IXRF Systems Incbased in USA
IXRF’s range of electronically cooled (LN2 free) Silicon Drift Detectors (SDD) are optimized when coupled with our innovative Ethernet based 550i digital pulse processor. Specifically configured to each customer's scanning electron microscope (SEM), IXRF's SDD detectors provide exceptional and stable performance over a wide range of ...
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Manufactured by VacCoat Ltd.based in UNITED KINGDOM
High Vacuum Sputter Coater – DST1-170 is configured as a Desk Sputter Coater suitable for Scanning Electron Microscope (SEM) sample preparation. A wide range of materials could be deposited by DST1-170 such as gold (Au), platinum/palladium (Pt/Pd) alloy, silver (Ag), chromium (Cr), tungsten (W), iridium (Ir), and etc. The DST1-170 ...
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Manufactured by Delmicbased in NETHERLANDS
METEOR overcomes the challenges in the current cryogenic electron tomography (cryo-ET) and cryo correlative light and electron microscopy (cryo-CLEM) workflows by providing the capability to perform in situ fluorescence light microscopy (FLM) in your cryo focused ion beam (FIB)/ scanning electron microscope (SEM) chamber. In addition to ...
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Manufactured by IXRF Systems Incbased in USA
microXRF X-ray sources for Scanning Electron Microscopes (SEM): addition of an polycapillary X-ray tube and Iridium Ultra software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental sensitivity for higher Z elements: sensitivity exceeding e–-beam ...
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Manufactured by IXRF Systems Incbased in USA
) and a sample within a Scanning Electron Microscope (SEM) instrument. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum (which is the main principle of spectroscopy). The peak positions are ...
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based in USA
The Thermo Scientific Helios 5 Hydra DualBeam (plasma focused ion beam scanning electron microscope, PFIB-SEM) can deliver four different ion species as the primary beam, allowing you to choose the ions that provide the best results for your samples and use cases, such as scanning transmission electron microscopy (STEM) and transmission ...
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Manufactured by Oxford Instruments plcbased in UNITED KINGDOM
C-Swift is the newest member of our CMOS detector family designed for routine materials analysis and high throughput sample characterisation. C-Swift benefits from many of the features that have made Symmetry S2 such a groundbreaking EBSD detector including, of course, a customised CMOS sensor designed for ...
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