Surface Analysis Equipment
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PremiumManufactured by Metrohm AGbased in SWITZERLAND
Microtrac and BEL-Japan joined together to launch a world-renowned Surface Analysis instrument product portfolio, which includes: Specific surface area & pore size distribution measuring instruments. Vapor adsorption measuring instruments. Chemical adsorption measuring instruments. High pressure adsorption/Rate of adsorption ...
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Manufactured by Kratos Analytical Ltd.based in UNITED KINGDOM
The AXIS Nova is a highly automated x-ray photoelectron spectrometer with uncompromised spectroscopic performance required for demanding research ...
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Manufactured by GelSightbased in USA
The GelSight Max is our highest resolution handheld surface analysis solution and designed for the most demanding applications, including surface and profile roughness from 0.2 to 20 µm. The GelSight Max immediately quantifies the surface characteristics of any material at any workflow location, regardless of composition, ...
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Manufactured by Remspec Corporationbased in USA
SpotView is a sensitive surface analysis system that uses FTIR spectroscopy at an oblique 'grazing' angle to detect organic compounds on surfaces. Quantities as low as 0.3 μg/cm2 on metal, glass, and some polymer surfaces. Objects such as computer hard drives and pharmaceutical reactor surfaces can be analyzed ...
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Manufactured by Kore Technology Limitedbased in UNITED KINGDOM
Understanding surface chemistry is no longer limited to university research labs, but is now increasingly important to many areas of mass-production; even a simple crisp packet is a highly engineered material system with multiple layers having different functions. Surface science instruments have typically been very expensive and ...
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Manufactured by Remspec Corporationbased in USA
The MiniSV™ is a sensitive surface analysis system that uses Infra-Red Reflection Absorbtion Spectroscopy (IRRAS) at a shallow or grazing angle to detect and quantify very low levels of IR absorbing materials on surfaces down to a monolayer or less. The small spot size (3 by 28 mm) means that it is ideal for mapping thin films on ...
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Manufactured by Remspec Corporationbased in USA
The ValveView jig has three translational adjustments, plus two rotational adjustments. This means that any small, hollow part can be positioned so that the mid-IR signal from the fiber-optic cable is reflected directly onto the MCT ...
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Manufactured by LuminUltra Technologies Ltd.based in CANADA
Are you experiencing premature equipment failure due to microbial-influenced corrosion? By forming and populating biofilms on pipe walls and surfaces, microorganisms can survive biocide treatment and accelerate corrosion. Monitoring biofilm development using LuminUltra Biofilm (DSA™ Test Kit) can be used to manage chemical ...
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Manufactured by Iontof Gmbhbased in GERMANY
With the Q ExactiveTM extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging. The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the Q ExactiveTM for unambiguous peak identification ...
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Manufactured by Kore Technology Limitedbased in UNITED KINGDOM
The SurfaceSeer I is a high sensitivity TOF-SIMS for imaging and chemical mapping of insulating and conducting surfaces. The SurfaceSeer I is ideal for investigating the chemistry of surfaces and is equally at home in R&D as well as industrial quality control applications. The SurfaceSeer I uses the same TOF-MS technology as the SurfaceSeer ...
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Manufactured by Hiden Analytical Ltd.based in UNITED KINGDOM
The IG5C features a low power, high brightness, surface ionization source coupled to a compact ion column, providing high performance in a small package. The gun is designed as a primary ion beam for all SIMS applications, dynamic, static and ...
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Manufactured by Hiden Analytical Ltd.based in UNITED KINGDOM
Hiden Analytical has developed a fully self-contained automatic surface analysis system in the AutoSIMS, an innovative secondary ion mass spectrometer (SIMS) that can perform routine and repetitive analysis with unattended operation. With a fully-automated X-Y stage and expanded holder, the AutoSIMS by Hiden can run hundreds of processes a ...
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Manufactured by Hiden Analytical Ltd.based in UNITED KINGDOM
The IG20 features a high brightness electron impact gas ion source which is designed specifically for oxygen capability but is also suitable for use with inert and other ...
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Manufactured by Hiden Analytical Ltd.based in UNITED KINGDOM
Hiden Analytical provides extremely versatile high-sensitivity instrumentation for high performance dynamic and static SIMS (secondary ion mass spectrometry) analysis, unlocking new levels of precision in cutting-edge applications. With an extended range and the ability to acquire and identify both positive (+ve) and negative (-ve) secondary ...
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Manufactured by Corning Incorporatedbased in USA
The Tropel FlatMaster provides industry-leading performance of surface form measurements for precision-component manufacturers. Our non-contact optical technique records the entire surface in ...
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Manufactured by GL Biocontrolbased in FRANCE
Validate and verify: your cleaning & disinfection procedures; Immediate: results in equivalent bacteria per cm² easily understandable; Reliable: because of the internal standardization. Avoid false negatives; Accurate: with sampling of a defined ...
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Manufactured by PASI s.r.l.based in ITALY
The 3D Land Geophone Mod. 3DLG-2 is the ideal accessory to add to your seismic instrumentation and perform HVSR, MASW and Vibration Analysis. One vertical and two horizontal high-performing sensors - with 2Hz resonance frequency and properly coupled - are mounted in a robust waterproof case, delivered with adjustable feet and ...
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Manufactured by Bruker Corporationbased in USA
The new benchmark for speed with highest resolution and performance: The Dimension FastScan delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating ...
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Manufactured by Hiden Analytical Ltd.based in UNITED KINGDOM
The Hiden TOF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm ...
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Manufactured by Hiden Analytical Ltd.based in UNITED KINGDOM
detection systems for research-scale thin film nanoscale surface analysis. The EQS SIMS analyser is an ideal add-on analyser for XPS and focused ion beam FIB microscopy systems. ...
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