NanoMagnetics Instruments

Model AFM/MFM - High Performance Atomic Force Microscope



hpAFM is the most advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimize the time to get best results. Whether you can work in liquid or in air conditions, it is for everyone from material science to life science. hpAFM offers excellent features such as alignment-free design, closed loop flexure scanner, decoupled z scanner, 10 MP video microscope and flexible operating modes.

Standard Modes

  • Contact Mode AFM (In air and liquid)
  • Dynamic Mode AFM (Tapping /intermittent contact AFM modes in both air and liquid)
  • Phase Imaging
  • Magnetic Force Microscope, MFM
  • Scanning Tunneling Microscope, STM
  • F-d Curves and Spectroscopy
  • Electrostatic Force Microscope, EFM
  • IV Curves and Spectroscopy with STM Module (pA- nA adjustable current range)
  • Non-contact AFM with 5 mHz Resolution Digital PLL
  • Force Volume Mode
  • Nanolithography
  • Nanomanipulation
  • Nanoindentation
  • Scanning Spreading Resistance Microscopy (SSRM)
  • Scanning Capacitance Imaging, SCI
  • Scanning Kelvin Probe Microscopy
  • Force Modulation Microscopy (Viscoelastisity)
  • Piezo Response Force Microscopy, PRFM

Optional Accessories

  • Conductive Mode AFM
  • Liquid Cell, Electrochemistry Cell
  • STM Probe Holder
  • Vacuum Chamber, Environment Chamber
  • Near Surface Optical Microscopy
  • Raman Spectroscopy
  • External variable magnetic field

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