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RigakuModel NEX CG II -Trace Element Analysis for Environmental Monitoring Applications by EDXRF

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NEX CG II is a multi-element, multi-purpose EDXRF spectrometer that performs rapid qualitative and quantitative trace elemental analyses and addresses needs across many industries. This next-generation, high-end spectrometer is ideal for trace heavy metal and halogen analysis, which is in increasing demand for several sectors. These capabilities make NEX CG II especially well-suited for trace element analysis for environmental monitoring applications, such as monitoring industrial waste streams to the sub-ppm levels, testing soils and recycled materials, electronic components, cosmetics, etc. NEX CG II excels in complex applications with trace elements and variable base matrices without needing a large set of calibration standards. Additionally, NEX CG II provides non-destructive analysis of sodium (Na) through uranium (U) in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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  • Non-destructive elemental analysis for sodium (Na) to uranium (U)
  • Rapid elemental analyses of solids, liquids, powders, coatings, and thin films
  • Indirect excitation for exceptionally low detection limits
  • High-power 50 kV, 50 W X-ray tube
  • Large-area high-throughput silicon drift detector (SDD)
  • Analysis in air, helium, or vacuum
  • Powerful and easy to use QuantEZ® software with multilingual user interface
  • Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
  • Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
  • Various automatic sample changers accommodating up to 52 mm samples
  • Low cost of ownership backed by a 2-year warranty

Unlike conventional EDXRF spectrometers, NEX CG II is an indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.