Raman-AFM and Nano-Raman (TERS)
Physical and Chemical imaging on a single platform. One powerful tool for all your needs. HORIBA's leading Raman technology is now integrated with outstanding scanning probe microscopy (SPM). The platform integrates Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques and confocal optical spectroscopy (Raman and fluorescence imaging) in one versatile instrument, for fast simultaneous co-localized measurements and Tip-Enhanced Raman Spectroscopy (TERS).
Tip-Enhanced Raman (TERS): Chemical Imaging at the Nanoscale
TERS brings you the best of both worlds: the chemical specificity of Raman spectroscopy with imaging at spatial resolution typically down to 10nm. This technique can be demonstrated on various samples ranging from 1D and 2D nanomaterials to DNA.
Unique features:
Unique features:
- Infrared AFM diode: no optical interferences with the spectroscopy detection, for all SPM modes including all AFM modes. Any typical laser can be used, from NUV to NIR, especially access to the red region for AFM required for TERS with gold probes.
- Optical access with high aperture objective lens (0.7NA) from both top and side: brings unequalled throughput and spatial resolution and optimized illumination conditions for TERS. Simple tip exchange; fully automated alignment and tuning: no knobs to adjust to align the AFM laser.
- High resonance-frequency scanner for high speed imaging and low sensitivity to acoustic vibrations. No need for active vibration isolation.
- Visual confirmation of alignment on all channels.
- Short path-length and closed-loop spectroscopy laser alignment: brings higher throughput and outstanding long term stability, critical for TERS imaging.
Not Just TERS: High-Speed TERS Imaging!
HORIBA Scientific does not only provide TERS capable systems, nor do we only guaranty TERS enhancement when measuring at a single point. HORIBA Scientific is the first equipment manufacturer to guarantee TERS imaging capability and nano-resolution thanks to our STM-TERS tips, AFM-TERS tips and test samples.
Raman-AFM: High-Speed, Simultaneous SPM and Spectroscopy
Co-localized AFM and Raman images of 1 layer, 2 layers and 3 layers graphene
- AFM and other SPM techniques like STM, shear force or NSOM, provide topographic, mechanical, thermal, electrical, and magnetic properties with molecular resolution.
- Confocal Raman spectroscopy and imaging provides specific chemical information about your nano-materials, with sub-micron spatial resolution.
- A unique platform for simultaneous measurements helps you spend more time getting results with the confidence the images you get are truly correlated.
- Combining high performance with ease of use, HORIBA offers a reliable and full-featured solution.
Unique Features:
- Infrared AFM diode at 1300 nm: no optical interferences with the spectroscopy detection, for all SPM modes including all AFM modes.
- Any typical laser can be used, from NUV to NIR, especially access to the red region for AFM required for TERS with gold probes.
Optical access with high aperture objective lens (...
- Optical access with high aperture objective lens (0.7NA) from both top and side: brings unequalled throughput and spatial resolution and optimized illumination conditions for TERS.
Simple tip exchange; fully automated alignment and...
- Simple tip exchange; fully automated alignment and tuning: no knobs to adjust to align the AFM laser.
High resonance-frequency scanner for high speed im...
- High resonance-frequency scanner for high speed imaging and low sensitivity to acoustic vibrations. No need for active vibration isolation to obtain the true molecular resolution.
Visual confirmation of alignment on all channels.
- Visual confirmation of alignment on all channels.
Short path-length and closed-loop objective scanne...
- Short path-length and closed-loop objective scanner laser alignment: brings higher throughput and outstanding long term stability, critical for TERS imaging.
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