Riga Analytical Lab

Riga Analytical Lab

Analytical Services

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Electrical Failure Analysis, Metallurgical Failure Analysis, Hot Spot Detection, Emission Microscopy, Voltage Contrast, Electrostatic Discharge Sensitivity Test (ESD), Latchup Evaluation, Dielectric Integrity Tests, Decoration Techniques, Optical Microscopy, Optical Beam Induced Current (OBIC), Scanning Electron Microscopy (SEM), Electron Beam Induced Current (EBIC), Focused Ion Beam (FIB) Circuit Modifications, FIB Electrical Troubleshooting, Circuit Extraction,  X-ray Radiography, Package Decapsulation, Sequential Stripback, Destructive Physical Analysis (DPA), Cross Section, Parallel and Angle Lapping, Focused Ion Beam (FIB) Cross Section, Structure Characterization, Fiberoptic Component Characterization, Solid State Laser Characterization, MicroElectroMechanical Systems (MEMS) Characterization, X-ray Energy Dispersive Spectroscopy (XED), Auger Electron Spectroscopy (AES), Secondary Ion Mass Spectroscopy (SIMS), Atomic Force Microscopy (AFM), MIL-STD Certifications.

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