Anadis Instruments Benelux B.V. products

The World`s First Ultra-Fast, Sensitive, Reproducible and Fully Automated Universal Raman Molecules Analysis System for Material Identification and Quantification.

Oil film on metallic surfaces can be inspected within a few seconds with the handheld device OFIS of Amepa, eliminating time consuming gravimetric or chemical analysis becomes. OFIS is designed for a rough industrial environments and easy to use. OFIS 2.0 measures oil films and hot melts in the range of 0,1 – 5 g/m² (10 – 500 mg/ft²).

Robust NIR spectrometer for in-line process applications. Brimrose`s NIR spectrometers deliver fast-responding and multi-component analysis for a variety of process applications. The spectrometers use the acousto-optic tunable filter technology resulting in excellent wavelength repeatability and a high signal-to-noise ratio. The instrument works reliably in harsh process conditions. The use of NIR for process applications (in-line, at-line, on-line) results in lower manufacturing costs.

Using plasma for sample preparation.  Harrick Plasma provides equipment to clean, activate, modify or sterilize surfaces. It can be used whenever you need to clean or modify surfaces. Anadis supplies the accessories for the plasma cleaners as well: quartz chambers, sample trays, vacuum and oxygen surface pumps. For a more precise, quantitative, gas flow rate, the PlasmaFlo is the instrument you need. It is also applicable for mixing of two gasses.

HTek delivers worldwide support on the analyser. Anadis delivers the instrument with accessory consumables and takes care of on-site or remote training-on-the-job. An instruction via a mp4 video is also available

The Jeol ElementEye (JSX-1000S) is a ED-XRF spectrometer, providing easy, quick elemental analysis. The instrument is easy to operate and uses touch panel operation. Swiping the screen makes it possible to switch between displays. Results are displayed real-time. The ElementEye achieves high sensitivity analysis throughout the entire energy range, thanks to the new optical system and the Jeol silicon drift detector. Little or no sample preparation is needed. Some of the wide range of applications are: plating thickness measurement, quantitative analysis of alloys, oxides and filler materials in polymers.

The success of FT-IR analyses is often hindered by the wavelength accuracy of the instrument. Many laboratories use polystyrene to verify the wavelength accuracy. To be really sure of your results, it would be better to perform this test with a certified polystyrene standard. Anadis can supply you with this standard from the National Physical Laboratory.

The UV/Vis / NIR spectrometer ETA of NXT before AudioDev should be used whenever you need to control coating thicknes of various materials such as packaging, polymers, paint, flat pannel, agricultural glass, solar panels and precision optics. The thickness is presented in a SPC chart and is available for in-line production control. The measurements are performed in transmission and/or reflection.

The PerkinElmer Frontier FT-IR is powerful and adaptable and can meet all your current analysis needs.  A wide range of smart modular sample accessories from PerkinElmer, Harrick Scientific, Pike en Specac provides the flexibility to measure almost any solid, liquid, powder or paste. The accessories can be changed quickly, maximizing instrument uptime. Electronically stabilized source hot spot increases long-term measurement and system alignment stability.