Applied Physics products

Analyze wide-size range materials through laser diffraction or other methods with Applied Physic`s 2000 Series Uniform Polymer Particles, NIST™ traceable polystyrene DVB particles with wider size distributions that mimic real world particles and work better on laser diffraction-type instruments. Particles meet the need for NIST traceable size standards that have slightly wider distributions than our monodisperse 3000/4000 series size standards. The wider distribution provides light scatter across a range of detectors, resulting in a more repeatable measurement.

20-900nm, PSL Spheres, polystyrene latex beads, calibration using polymer microspheres as particle size standards   PSL Spheres are excellent for use with any application that requires a NIST traceable size standard with a very narrow peak standard deviation.

Polystyrene Latex Microspheres, 1-160 Micron, PSL Spheres, polystyrene latex beads and NIST traceable microspheres are used as particle size standards.

Minimize response of analytic systems to shape effects with Applied Physics 4000 Series Dry Monosized Particles, excellent for use with any application that requires a NIST™ traceable size standard with a very narrow standard deviation.

100nm to 10 micron, Particle Counter Standards, polystyrene latex beads, microspheres for particle size standards   Particle Counter Standards are used specifically to calibrate laser particle counters and liquid particle counters that require a NIST traceable size standard with a very narrow peak standard deviation. Particle Counter Standards are highly uniform polystyrene microspheres calibrated within nanometers referenced to NIST SRM size standards for size traceability. 

Particle size standards are used for calibration of instruments that need a NIST traceable accuracy with narrow size peaks and tight standard deviations. These particle  standards are uniform polystyrene latex spheres produced with NIST traceable, size accuracy. Polystyrene beads are used to produce polystyrene microspheres are used to calibrate particle counters and produce Calibration Wafer Standards to confirm size accuracy of KLA SP1, KLA SP2, KLA SP3, as well as Hitachi wafer inspection systems. 100 nm to 100 micron, Particle Counter Size Standards for size calibration of laser particle counters and liquid particle counters.

NIST, Standard Reference Material, polystyrene microspheres and beads used in Calibration and Contamination Wafer Standards to verify size accuracy of KLA and KLA-Tencor wafer inspection systems.

Surf-Cal, Particle Size Standards, 50ml Volume, Pre-Mixed to 1x10E8 and 1x10E10 Concentration / ml.

Applied Physics USA Provides Polystyrene Dry Powder, Particle Size Standards.   PSL Spheres, polystyrene latex beads, calibrated polymer micro-spheres for particle size standards used to calibrate airborne optical particle counters. OPC counters are required to meet ISO 21501-4 requirements for size calibration.