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Atomic Force Microscopes (AFM)
High-Resolution Atomic Force Microscope for PPMS from Nanoscan
This high-resolution AFM (Atomic Force Microscope) of less than 25 mm diameter was designed to fit perfectly into the PPMS®(Physical Property Measurement System) of Quantum Design. It offers all common measurement modes, such as contact mode and intermittent contact mode, plus the PLL-controlled true non-contact mode and high-resolution MFM mode. Combining the AFM with the PPMS® provides the researcher with a versatile nanoscale imaging tool in a variable temperature and variable magnetic field environment. The broad temperature range of 4–400 K and the available magnetic field options of up to 16 T promise exciting new studies on phase transitions, superconductors, magnetic thin films, 2DEG, etc.
Observing Opaque Samples at the Nanoscale with AFM
Perfect images of opaque samples from the micro to the nanoscale. No compromises. Key Features: Completely integrated system comprising upright optical microscope and AFM, Developed for the investigation of opaque samples in life and materials sciences, 100% performance of both techniques, without any limitations, Outstanding reproducibility of the focussed position (ROI) with both systems, Unique capability to investigate the ROI precisely with optics and AFM, Also perfect during operation in liquids, Wide range of applications: Biochips, cell chips or patterned substrates for cell adhesion, nanostructured surfaces from PDMS or other imprints, lipid bilayers, biomarkers such as quantum dots, rods, CNT ..., Flexible concept with shuttle stage, Both techniques can be operated even in different laboratory rooms.
