CAMECA SAS products
SIMS
Cameca - Model IMS 7f-Auto - Detection Sensitivity with High Throughput & Full Automation
The IMS 7f-Auto is the latest version of our successful IMS xf Secondary Ion Mass Spectrometer (SIMS) product line. Designed to deliver high precision elemental and isotopic analyses with increased ease-of-use and productivity, it has been optimized for challenging applications such as glass, metals, ceramics, Si-based, III-V and II-VI devices, bulk materials, thin films... fulfilling industry requirements for efficient device development and process control.
Cameca - Model IMS 7f-GEO - Compact, High Throughput SIMS for Geoscience Laboratories
The IMS 7f-GEO is a mono-collection SIMS model specifically designed to perform high precision / high throughput measurements in geological samples, i.e. stable isotopes, REE (Rare Earth Elements), trace elements... It is also used for material sciences analyses and environmental studies.
Model IMS 1300-HR³ - Large Geometry Ion Microprobe for Geosciences
Model KLEORA - The Specialized Ion Microprobe for World-leading Research in Geochronology
Model NanoSIMS 50L - Sims Microprobe For Isotopic and Trace Element Analysis at High Spatial Resolution
ATP
CAMECA - Model LEAP 5000 - 3D Atom Probe Microscope
The LEAP 5000 is CAMECA`s cutting-edge atom probe microscope, offering superior detection efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected per nm3 analyzed.
Cameca - Model EIKOS-UV - Atom Probe Microscope
The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry. Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS™, the Atom Probe microscope for rapid alloy development and nanoscale materials research.
Model Invizo 6000 - The 3D Atom Probe With the Largest Field Of View
The Invizo 6000 3D Atom Probe microscope introduces major technology breakthroughs to push the boundaries of atom probe analysis. Its ultra wide field of view flight path and unique dual-beam deep UV laser pulse system result in higher single-specimen yield and a greater analysis volume with improved reconstruction fidelity, allowing more information to be obtained from each dataset. The Invizo 6000 is an ideal choice for advanced research on a diverse set of applications.
Model LEAP 6000 XR - The First 3D Atom Probe with Combined Voltage & Laser Pulsed Operation
The LEAP 6000 XR inherits key features from previous APT generations, adding deep UV laser pulsing to the proven local electrode design to deliver higher yield and data quality. Through compatibility with the microtip array and a redesigned optical system, the LEAP 6000 XR provides enhanced ease of use and the potential for fully automated operation.
