Corning Incorporated products
Analytical Instruments Metrology Instruments
Tropel FlatMaster - Surface Form Analysis System
The Tropel FlatMaster provides industry-leading performance of surface form measurements for precision-component manufacturers. Our non-contact optical technique records the entire surface in seconds.
Tropel FlatMaster - Model MSP - Multi-Surface Profiler
The Tropel FlatMaster MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
Corning Tropel UltraFlat - Model 200 - Photomask Flatness Measurement
The Tropel UltraFlatTM 200 Mask System was designed specifically for the photomask industry. It delivers the lowest measurement uncertainty for ever-tightening mask flatness specifications. Shrinking device features require not only flatter wafers, but flatter masks.
