COXEM Co., Ltd products

The EM-40 represents COXEM`s latest addition to their expanding family of Tabletop SEMs. The EM-40 comes with ultra-fast 5th-generation signal processing technology and provides high-quality imaging at frame rates of up to 13 fps. Four imaging modes (Fast, Slow, UltraFast, and Photo) allow the user to choose the image quality and speed that best fits their application.

a full-size floor model Scanning Electron Microscope (SEM) that both new and experienced users will find suitable for many type of demanding research and quality control requirements. The standard supplied configuration of the CX-200plus includes both SE and BSE imaging detectors as well as an internal chamber view camera for easy stage tilt and height adjustments. The CX-200plus offers high resolution imaging capabilities at a very attractive price. After evaluating the CX-200plus, your search for the most cost effective solution will be an easy decision.

The CP-8000+ is an advanced sample preparation tool that etches a cross section of a sample using an argon ion beam. This process avoids physical deformation and structural damage, without requiring complicated chemical processes. In addition, the system simplifies cross-sectional analysis of the sample by processing large areas from tens of um to several mm.

The ion coater, SPT-20, is a device used for coating conductive materials (Au, Pt, Pd, Pt-Pd) onto the sample surfaces by using DC sputtering principle. Non-conductive samples are also used for observation under electron microscopes, and they are used to protect the sample surfaces from the injected electron beam and to help the electron flow. It can be used as an electrode formation of thin film type too. 1. Digital ion coater 2. Vacuum. coating. One touch coating system up to the normal pressure 3. Stable coating with coating Current Feedback function 4. Can be used with various metal targets 5. Uses low-noise rotary pump

Optional product STEM is an analysis tool used to generate transmission images, on the basis of a table-top ‘Scanning Electron Microscope’ (SEM), by detecting electrons that had been projected onto a specimen in a two-dimensional manner through electron beams generated by an electron gun. This tool allows scholars in the ‘life sciences’ field to observe the information of cells beneath the surface and their structure and, in material science, nanostructures by using its small braille beams and rich luminance.