Helmut Fischer
10 products found

Helmut Fischer products

Coating Thickness - X-RAY Fluorescence Method (XRF)

FischerScop - Model XUL Series - X-RAY Fluorescence Measuring (XRF) Instruments

Robust Entry-Level X-RAY Fluorescence Measuring (XRF) Instruments for Non-Destructive Material Analysis and Coating Thickness Measurement. Measurement instruments from the XUL series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The X-ray fluorescence instruments measure from bottom to top, enabling easy positioning of samples on the measuring stage. All X-ray instruments in this range are equipped with the same detector. You can choose apertures, filters and X-ray tubes according to the individual measurement task.

FischerScop XULM - X-ray Fluorescence (XRF) Measuring Instrument

X-ray fluorescence (XRF) measuring instrument for coating thickness measurements and analyses, even on small components.

X-RAY XRF Fluorescence Instruments

GOLDSCOPE SD - Model 600 - Advanced Gold and Precious Metal Analyzer

The new GOLDSCOPE SD® 600 is Fischer`s most powerful XRF analyzer for gold and jewellery testing as well as precious metals analysis. Specifically designed for hallmarking, gold refinery, jewelry retail stores, punch and assaying, it is easy to operate and extremely powerful. Measuring top down, the sample is simply placed on the manually operated scissor table. A laser pointer serves as positioning aid. Thus, even samples with complex geometries are no challenge to analyse.

FISCHERSCOPE - Model X-RAY XUL Series - XRF Analyzer

The FISCHERSCOPE® X-RAY XUL® series is truly fundamental equipment for every electroplating shop. These straightforward and affordable energy dispersive X-ray fluorescence XRF analyzers are excellent for monitoring the bath composition, but they’re also indispensable helpers when it comes to quality control: robust and perfectly suited for measuring galvanic coatings on mass-produced parts like nuts and bolts.

FISCHERSCOPE - Model X-RAY XAN - XRF Analyzer

Like the XUL series, the XRF instrument spectrometer FISCHERSCOPE X-RAY XAN are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze the composition of alloys (e. g. copper). In total, the XAN series comprises 5 bench-top XRF spectrometers that cover a wide range of applications. The XAN 215 has a cost-effective PIN detector. This XRF Instrument It’s is ideal for simple coating thickness tasks, e.g. zinc on iron or Au/Ni/Cu. For more complex applications with alloys or precious metals, we recommend our XRF instruments devices with a silicon drift detector (e.g. the XAN 220): Due to its much higher resolution, it can reliably distinguish between gold and platinum. And when you need to detect traces of heavy metals and other hazardous substances, the XAN 250 is your solution.

FISCHERSCOPE - Model X-RAY XAN 500 - XRF Analyzer

The FISCHERSCOPE® X-RAY XAN® 500 is the most versatile X-ray fluorescence (XRF) system available. As a handheld XRF analyzer, it’s perfect for inspecting coatings on bulky items like airplane parts, pipes or turbine blades in a running production line. In contrast to other portable XRF devices on the market, the FISCHERSCOPE XAN 500 determines coating thickness very precisely. Its 3-point support makes it easy to place correctly and keeps it stable during the entire measurement. A high-quality silicon drift detector (SDD) ensures the precision needed to analyze alloy layers such as zinc-nickel. But the XAN 500 is more than just a XRF measuring system for bulky parts. With the optionally available measuring box, it can be transformed into a bench-top instrument in just a few simple steps. This lets you quickly and easily check small parts such as nuts and bolts.

FISCHERSCOPE - Model X-RAY XDL AND XDLM - XRF Analyzer

The FISCHERSCOPE X-RAY XDL and XDLM X-ray fluorescence (XRF) spectrometers are closely related to the XUL series. All the main components – such as the detector, X-ray tubes and filter combinations – are identical. But there is a significant difference: The XDL and XDLM devices measure from top to bottom. And that means convenient XRF analysis of non-flat samples – complex shapes are no longer a problem!

XRF Materials Analysis

FischerScope - Model XAN 315 - X-ray Fluorescence (XRF) Measuring Instrument

The main application of the instruments from the XAN range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters can be adapted according to requirements, so that the optimal measurement instrument is available for every material composition.

FischerScope - Model XAN 220 - X-RAY Fluorescence Measuring (XRF) Instruments

The main application of the instruments from the XAN range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters can be adapted according to requirements, so that the optimal measurement instrument is available for every material composition.

Micro and nanoindentation

FischerScope - Model HM2000 - Measuring System for Microhardness Measurement

FISCHERSCOPE HM2000 is a professional microhardness measurement instrument for the analysis of mechanical and elastic properties of materials by means of nanoindentation. Its very rigid and dimensionally stable construction reduces the influence of vibrations and fluctuations in temperature. Constant measurement conditions make it ideal for demanding measurement tasks in research and industrial applications. Moreover, its semi-automatic measurement procedures make it ideal for serial testing.