Molecular Vista products

VistaScope is a unique AFM with flexible & full optical access to the tip/sample region. The VistaScope controller comes equipped with multiple lock-in amplifiers that allow patented photo-induced force microscopy (PiFM) and patented demodulation technique for background suppressed scattering scanning near-field optical microscopy (s-SNOM). It provides the ultimate capability in tip-enhanced optical microscopy as well as co-located AFM and far field optical techniques such as confocal Raman and confocal photoluminescence.

Vista-IR combines AFM with IR (AFM-IR) spectroscopy to provide IR spectral imaging with unprecedented sub-10 nm spatial resolution. Its patented photo-induced force microscopy (PiFM) measures the near-field optical response of the sample via mechanical force detection, making the technique robust and easy-to-use. Reliable and repeatable PiFM spectrum from 10-nm region provides “nano-FTIR” spectrum in less than a second.