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OEwaves, Inc. products
Ultra-Narrow Lasers
OEwaves HI-Q - Model OE4045 - Blue Laser
Blue laser with ultra-narrow Lorentzian Linewidth and low phase/frequency noise in a compact form factor in the 435 nm – 480 nm range. The HI-Q laser houses a proprietary driver/controller and the OEwaves laser source which is based on a high quality factor (Q) Whispering Gallery Mode (WGM) optical micro-resonator. The laser is available at a variety of wavelengths from 435 nm to 480 nm.
Opto-Electronic Oscillators
OEwaves HI-Q - Model OE3720 - Ultra-Wideband Photonic Synthesizer
The unique design of the OEwaves HI-Q® VCO is based on photonic generation of spectrally pure signals at millimeter wave frequencies with phase noise that is independent of frequency. This is accomplished with patented technology of semiconductor lasers injection locked to ultrahigh quality factor (Q) crystalline optical whispering gallery mode resonators. The high performance VCO allows enhanced radar system visibility, stable clocking, increased channel capacity for communication systems, data links, and high capacity and high frequency next generation wireless systems. This level of performance in a small form factor enables new capabilities in legacy systems as well as new markets for a variety of terrestrial airborne, and space and small satellite applications.
Laser Noise Analyzer
OEwaves Hi-Q - Model OE4001 - Optical Test Measurement System for RIN Analysis
The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.
RF Noise Analyzer
OEwaves Hi-Q - Model OE8000 - RF Test Measurement System (TMS)
HI-Q® RF Test Measurement System (TMS) utilizes microwave photonics techniques for automated measurement of ultra-low phase noise oscillators.
