Particle Vision GmbH services

The collection of the sample is crucial – We offer for each specific problem/question the appropriate sampling method and substrate.

Question orientated analyses are the key for success. Light microscopy for the determination of morphological parameters of single particles >2.5 µm in diameter. Scanning electron microscopy (SEM) for the determination of morphological parameters of single particles >20 nm in diameter. STEM detector for the determination of morphology of particles < 100 nm in diameter. Energy dispersive X-ray spectroscopy (EDS) for the determination of the chemical composition of single particles. X-ray diffraction for the determination of the mineralogy of the total dust (bulk sample). X-ray fluorescence for the determination of the chemical composition of the total dust (bulk sample). We offer further numerous systematic analyses in cooperation with our partners.

Scanning electron microscopy is used for high-resolution morphological and chemical characterization of a wide range of surfaces. Surfaces are scanned with an electron beam producing a detailed surface image (SE detector). With the help of different detectors (BSE and EDS) chemical variability and specific chemical compositions can be determined.

Single particle analysis is a general term for analytical methods that deal with the analysis of single dust particles and not total dust.  The advantage of these methods is that chemical and morphological criteria can be combined. And the information obtained for each single particle contributes to the characterization of the total dust.