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Vibrometry - QTec Product line
Polytec - Scanning Vibrometer
VibroScan QTec measures vibrations in a new way – non-contact and with unprecedented precision. With its groundbreaking multi-path interferometry and diversity combining, QTec sets new standards in terms of optical sensitivity and interference immunity. It determines operating waveforms and eigenmodes for NVH, acoustics, structural dynamics, ultrasound, FEM validation and non-destructive testing and offers frequency ranges up to 32 MHz. With its SWIR wavelength, the Xtra Laser brings more power to the measurement. This means that larger measuring distances are realized. The combination with QTec makes the Xtra laser insensitive to the angle of impact and surface.
Polytec - Scanning Vibrometer
VibroScan QTec Xtra 3D measures three-dimensional vibrations in a new way - non-contact and with unprecedented precision. With its groundbreaking multi-path interferometry and diversity combining, QTec sets new standards in terms of optical sensitivity and interference immunity.
Vibrometry - Single-Point Vibrometers
Polytec - Single-Point Vibrometer
The new flexibility in optical vibration measurement from nano to macro-sized structures. With VibroFlex, Polytec presents the superior flexibility in optical vibration measurement with a modular sensor solution that adapts to your needs: Choose from laser sensor heads with different laser wavelengths and technologies like QTec. Add microscope optics for tiny structures or measure large, complex samples like machinery or motors from a safe distance. Discover acoustics and vibration phenomena in research and product development for a faster time-to-market or use it for reliable in-line inspections of your production parts with the focus on cost-efficiency.
Vibrometry - Full-Field Vibrometers
Polytec - Scanning Vibrometer
VibroScan QTec measures vibrations in a new way – non-contact and with unprecedented precision. With its groundbreaking multi-path interferometry and diversity combining, QTec sets new standards in terms of optical sensitivity and interference immunity.
Vibrometry - Microscope-Based Vibrometers
Polytec - Micro System Analyzer
Dynamic characterization of MEMS devices to measure and visualize mechanical response is important for product development, trouble shooting and FE model validation. The MSA Micro System Analyzers from Polytec provide fast, accurate optical measurements of out-of-plane (OOP) and in-plane motion (IP). Until now, this has been limited to unpacked devices that are optically accessible. Now, the Polytec MSA-650 IRIS Micro System Analyzer allows even measuring through intact silicon caps on encapsulated microstructures like e.g. inertial sensors, MEMS microphones, pressure sensors and more.
Vibrometry - Special-Application Vibrometers
Polytec - Vibration Measurement System
VibroFlex TriMount is a modular setup for non-contact 3D vibration measurements, consisting of a sturdy sensor holder with three VibroFlex Compact measuring heads, each interacting with a powerful VibroFlex Connect front-end. This combination enables precise and reliable vibration measurements with a frequency bandwidth up to 24 MHz for a wide range of applications. Its latest generation FPGA-based signal processing takes care of decoding raw measurement data in displacement, velocity and acceleration.
Velocimetry - Optical Length and Speed Sensors
ProSpeed - Laser Surface Velocimeter
Precise speed and length measurements are critical for controlling the production of continuous materials, sheet materials and piece goods. ProSpeed – the next generation LSV Laser Surface Velocimeters – optimize production processes by providing reliable measurements and increase the output worldwide in the metals, cable and converting industries. The ProSpeed LSV-2100 optical sensor determines the direction of motion and standstill conditions with laser precision.
Surface Metrology - Optical Profilers
Polytec - Table-Top Optical Surface Profiler
TopMap Micro.View is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View measures complex topographies at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure.
Polytec - Optical Surface Profiler
Next generation optical surface profiler for surface finish, surface roughness and microstructures. TopMap Micro.View+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View + delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing visualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data visualization of engineered surfaces.
Polytec - Optical Profilers
Measuring form parameters like flatness, parallelism or step-height for reliable surface quality inspections and pass-fail analysis. The TopMap Pro.Surf quickly, reliably and precisely determines form deviation. TopMap Pro.Surf, the high-end solution, is ideal for measuring precision-made surfaces – in the metrology chamber, close to production or even right on the production line thanks to a high level of repeatability.
