Sinton Instruments products

The WCT-120PL wafer lifetime measurement tool showcases the same unique measurement and analysis techniques as the WCT-120 with the added capability of a photoluminescence (PL) detector to measure the PL lifetime and doping of the sample under test. Both the Quasi-Steady-State -Photoconductance (QSSPC) lifetimae measurement method and the Transient Photo-conductance Decay (PCD) lifetime measurement method are complemented with a calibrated PL lifetime measurement. The tool can also easily be used as a standard WCT-120. Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard (QSSPC) method and the photoluminescence (QSSPL) method.

The FPS-300 is a new flash power supply designed to replace the Quantum power supply stack and flash head.

The FPS-150 is a new flash power supply designed to replace the FPS-100 flash power supply.