Advanced Wafer Probe Cards - Brochure

The industry-leading performance of the HFTAP K32 product joins FormFactor’s series of High Frequency Test probe cards, including the K10, K16 and K22 used for testing 1.0 GHz, 1.6 GHz, and 2.2 GHz DRAM devices. Advanced PCB technology, exclusively available from FormFactor, allows the fastest communication between the Device Under Test (DUT) and Automated Test Equipment (ATE). By utilizing FormFactor’s Matrix architecture, HFTAP K32 probe cards can test at speeds that no other full wafer contactor can achieve. The extended capability of FormFactor’s HFTAP K32 probe card architecture enables DRAM customers on wafer-level speed testing up to 3.2?GHz/ 6.4?Gbps for next generation known-good-die (KGD) memory. The recent industry-wide adoption of heterogeneous integrated systems enabled by 2.5D and 3D advanced packaging technology is driving the demand for KGD.