AST - Model 300-PCI - Advanced Probe Card Inspection System - Brochure

The AST-300-PCI system utilizes a larger format system platform capable of inspecting an entire 300mm probe card at wafer level or a fully assembled probe card that is in its final integration state.  Since probe cards can vary in size, shape, and weight, AST can help you determine if an AST-300-PCI platform meets all your probe card designs or if an AST-500 platform is better suited for addressing your specific probe card requirements and design variations.  This system platform can also be leveraged to address automated inspection at the wafer and/or sub-assembly level providing a solution to keep critical processes in control and meeting required quality metrics.