attocube - Model attoAFM I - Scanning Probe Microscopes for Low Temperature - Brochure

The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperature, and in high magnetic fields. The instrument works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical interferometer. This deflection detection technique has the advantage that it comes with a built-in length gauge for the cantilever oscillation amplitude, since the interferometer contrast is directly proportional to the laser wavelength. Both contact and noncontact mode are applicable.