Environmental applications of Horizon TXRF spectrometer - Application Note

TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the X-Ray beam strikes the sample, deposited as a thin layer on a carrier, at a very small incidence angle, in order to exploit the excitation enhancement given by the total reflection effect. As far as the sample is thin enough (thin film approximation), the technique’s main strengths are: no matrix effect, no matrix dependent calibration curves, improved detection limits (LOD), simultaneous multi-element analysis, minimum amount of sample, microanalysis capabilities.