Hitachi High-Tech - Model X-Strata920 - Brochure

Coating thickness measurement based on X-ray fl uorescence (XRF) is an industry-proven technique, off ering fast and non-destructive analysis. The X-Strata920 is designed to measure singlelayer and multi-layer coatings – including alloyed layers – for both the electronics and metal fi nishing industries. Our in-house applications experts have optimised the X-Strata920 to ensure you get reliable, repeatable results for hundreds of applications including PCB surface fi nishes, connector coatings, corrosion resistance, decorative fi nishes, wear resistance, high temperature resistance and more. Where every mil or micron counts, the X-Strata920 gives you the precision and reliable results you need.