Hitachi High-Tech - Model X-Strata920 - Brochure

Coating thickness measurement based on X-ray fl uorescence (XRF) is an industry-proven technique, off ering fast and non-destructive analysis. The X-Strata920 is designed to measure singlelayer and multi-layer coatings – including alloyed layers – for both the electronics and metal fi nishing industries. Our in-house applications ...