HT7700-EXALENS-HTD-E207- Brochure

High Resolution LensFor Hitachi Model 120 kV Compact-Digital TEMOutline (with high resolution lens and STEM system)The HT7700 TEM with a maximum acceleration voltage of 120kV provides a larger ?eld of view at lower magni?cation in addition to high contrast/high resolution observation by means of Hitachi's unique double-gap objective lens technology.The new high resolution objective lens achieves a spatial resolution of 0.14 nm at low accelerating voltages with minimal beam damage.Introducing the High Resolution Objective Lens for Low Accelerating Voltage, High Resolution Analysis of NanomaterialsSpecimen: Gold single crystal Accelerating voltage: 100 kVLens mode: HR modeMagni?cation: ×600 k?Electron source: LaB6 filament?Resolution: 0.144 nm (Lattice image) at 120 kV, gold single crystal?Accelerating voltage: 40 ~120 kV (100 V step)?Magnification: Zoom ×200 ~ ×300,000 (HC Mode)? ×2,000 ~ ×800,000 (HR Mode) (Range of SA condition: ×2,000 ~ ×100,000) Low Mag ×50 ~ ×1,000?Camera length: 0.2 ~ 8 m HC Diff mode? 0.2 ~ 4 m HR Diff mode?Maximum tilting angle of specimen stage: ±30° (Standard single axis holder)?STEM function: OptionThis figure shows the TEM image of a gold (100) single crystal taken by the tilted illumination technique. At an accelerating voltage of 100 kV, both 0.144 nm lattice constant corresponding to Au (220) and 0.204 nm lattice constant corresponding to Au (200) and Au (020) are clearly seen.of 0.14 nm at low acccelerating voltages with minimal beam damage.4 nm at low acPoint and lattice resolution are improved due to a minimized lens spherical aberration coef?cient, enabling better high resolution analytical performance.Low damage, high contrast image observation is possible at low acceleration voltages.CharacteristicsResolution testSpecificationspact-Digital TEMfor Low Accelerating Voltage, ???????Examples of high-resolution observation?Si single crystalSpecimen: Si single crystalAccelerating voltage:120 kVLens mode: HR modeMagni?cation: ×500 kSpecimen: MWCNTAccelerating voltage: 120 kVLens mode: HR modeMagni?cation: ×400 kApplication dataThe 0.27 nm spacing corresponding to (002) lattice plane, and the 0.314 nm spacing corresponding to (111) lattice plane can be clearly observed. This result suggests the resolution of 0.27 nm will be possible by on-axis (point) observation by the high-resolution lens of the HT7700.?Multi-walled carbon nanotube (MWCNT)The 0.34 nm lattice plane of MWCNT can be clearly observed by defocusing the image to increase contrast in this weak phase object. This result suggests that the fine lattice image can be obtained at 120 kV with minimum electron irradiation damage to carbon nanostructures.Examples of low accelerating voltage observation?PyrophylliteSpecimen: Pyrophyllite crystalAccelerating voltage: 60 kVLens mode: HR modeMagni?cation: ×400 kCrystal (110) lattice plane images with a 0.45 nm spacing can be observed in three directions at an accelerating voltage of 60 kV.?HydroxyapatiteSpecimen: Hydroxyapatite crystalAccelerating voltage: 40 kVLens mode: HR modeMagni?cation: ×300 kCrystal lattice plane with a spacing of 0.816 nm can be observed without damaging the specimen at an accelerating voltage of 40 kV.Printed in Japan (H) HTD-E207 2012.7Speci?cations in this catalog are subject to change with or without notice, as Hitachi High-Technologies Corporation continues to develop the latest technologies and products for our customers.Notice: For correct operation, follow the instruction manual when using the instrument.* This brochure is for US distribution only./global/em/Copyright (C) Hitachi High-Technologies Corporation 2012 All rights reserved.For technical consultation before purchase, please contact:contact@nst.hitachi-hitec.com