HT7710_Datasheet- Brochure

Scanning TransmissionElectron Microscope (STEM) systemFor Hitachi Model HT7700 120kV Compact-Digital TEMThe HT7700 TEM, with a maximum acceleration voltage of 120kV, has been widely used to examine biological and soft-materials due to its superior resolution and high contrast performance. To further enhance the analytical capabilities of the HT7700, we have developed an optional high performance Scanning Transmission Electron Microscope (STEM) system.The HT7700 TEM, with a maximum acceleration voltage of 120kV, has been widely used to examine biological and soft-materials due to its superior resolution and high contrast performance. To further enhance the analytical capabilities of the HT7700, we have developed an optional high performance Scanning Transmission Electron Microscope (STEM) system.The HT7700 TEM, with a maximum acceleration voltage of 120kV, has been widely used to examine biological and soft-materials due to its superior resolution and high contrast performance. To further enhance the analytical capabilities of the HT7700, we have developed an optional high performance Scanning Transmission Electron Microscope (STEM) system.Outline (with STEM)Embedded STEM GUIHigh resolution STEM for nanoscale analysis.Low magnification and wide field of view image observation for specimen structure/orientation and particle size analysis.All necessary STEM operations are embedded in the HT7700 GUI.Bright Field (BF) and Dark Field (DF) detectors are available and display of BF-STEM and DF-STEM images is supported.By means of DF-STEM, Z-contrast imaging facilitates further chemical/structural analyses. All STEM images are archived and managed in the EMIP database software, the same as TEM images. Functions such as CD measurement, Line Profiling and Auto Drive are also supported for STEM images.Data are stored in TIFF (16 bit) or BMP or JPEG format.Combined with EDX, perform compositional analysis of small selected areas.Specifications DetectorsData examplesImage resolutionDetectorMagnificationScanning mode1.5nm (BF-STEM, 100kV, defined by measuring the gap of sputtered gold particles)BF-STEMDF-STEM (Option)×1,000?×800,000 (High Mag mode)×1,000?×100,000 (Normal mode)×100?×2,000 (Low Mag mode)Normal scanSelected area scanLine scanPoint scanArea analysisDigital scan (option)Data formatData bitImage recordingresolutionTIFF, BMP, JPEG16 bits (TIFF)640 × 480 pixel1,280 × 960 pixel2,560 × 1,920 pixel5,120 × 3,840 pixelBF-STEM image DF-STEM imageSpecimen?HIPS (High Impact Polystyrene) Vacc?100kV Magnification?×30,000Printed in Japan (H) HTD-E198 2012.2Specifications in this catalog are subject to change with or without notice, as Hitachi High-Technologies Corporation continues to develop the latest technologies and products for our customers.Notice: For correct operation, follow the instruction manual when using the instrument./global/em/Copyright (C) Hitachi High-Technologies Corporation 2012 All rights reserved.For technical consultation before purchase, please contact:contact@nst.hitachi-hitec.comEDX detectorCharacteristic X-rayDF-STEM detectorBF-STEM detectorCCD cameraTransmission electronScattered electronSpecimenObjective lensScanning coilElectron beam