Jeol USA Inc
  1. Companies & Suppliers
  2. Jeol USA Inc
  3. Downloads
  4. Jeol - Model JIB-4700F - Multi Beam ...

Jeol - Model JIB-4700F - Multi Beam System - Brochure

Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed theJIB-4700F Multi Beam Systemto be used in morphological observations, elemental and crystallographic analyses of a variety of specimens.

Most popular related searches