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Jeol - Model JIB-4700F - Multi Beam System - Brochure
Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed theJIB-4700F Multi Beam Systemto be used in morphological observations, elemental and crystallographic analyses of a variety of specimens.
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