Lens Unit Check and Adjustment System-LUCAS

Lens Unit Check and Adjustment SystemThe LUCAS (Lens Unit Check and Adjustment System) is a equipment that inspects and adjusts a lens unit using Shack-Hartmann wavefront sensor. Taking advantage of its high-speed and stable performance, it is well suited to introduce into product line that requires tact time reduction.Measurement accessory can be chosen and system tooling can be changed easily.It has great prospects for the future and allows you to leverage the system entirely for a long term.¦ Product Outline?Since the LUCAS has a wide dynamic range it can measure the large aberration that is difficult to be measured with the interferometer.?Wavefront aberration can be measured in real time by high-speed graphic updating. (Max.3Hz) ?It is equipped with 635nm light source for measurement.?It is insusceptible to vibration and temperature so that it can carry out the stable measurement during the production process.?Wavefront measurement software that is dedicated for the LUCAS is included.¦ Features?Inspection of aspherical lens and convex-concave lens.?Adjustment for lens unit and optical devices.?Inspection of reflection and transmissive wavefront of planar object.¦ ApplicationsAchieves a stable wavefront measurement in real-time at a low price.LUCASPCnote:PC is NOT included in the product. LUCAS Base UnitUSB KeyIEEE1394cableRCA cableWavefrontSensor635nmParallel light SorceCCDAlignment MonitorSelect the Accessorydepends onthe measurement object.MEMOPULSTEC INDUSTRIAL CO.,LTD.The content of these specification may change without notice.7000-35 Nakagawa,Hosoe-cho,Kita-ku,Hamamatsu-city,Shizuoka-Pref.,431-1304 JapanE-mail : sales@pulstec.co.jpPhone:+81-53-522-3611 Fax :+81-53-522-3666http://www.pulstec.co.jp? Specifications of the LUCAS Base Unit System? Block Diagram of the LUCAS Base Unit System? Dedicated Accessories for the LUCASMeasurement WavelengthEffective DiameterAccuracyRepeatabilitySpatial ResolutionUpdate RateInterfaceOperating TemperatureSize / Weight635nm (Measurable Wavelength Range : 400-800nm *1)f4.0 - 9.6mmf8.0 - 18.4mm : 2x with Beam Expanderf12.0 - 27.5mm : 3x with Beam Expander< 1/100? RMS(3s) *2< 1/500? RMS (3s) *2180µm (Typ.)10Hz (Max)IEEE1394 (6pin)15 - 35180×330×130mm(W×D×H) / 7.2kg (Base Unit)* 1 :* 2 :¦ B e a m E x p a n d e r ( 2 x a n d 3 x )¦ C o n d e n s e r L e n s¦ Ve r t i c a l l y o r T r a n s v e r s e l y s i t u a t e u n i t¦ T r a n s m i s s i v e 5 - a x i a l s t a g e f o r i n t e n d e d l e n s¦ 3 - a x i a l s t a g e w i t h r e f e r e n c e s p h e r e¦ 2 - a x i a l s t a g e w i t h r e f e r e n c e f l a tRequire to get the reference or each of Wavelength.Affected by the beam intensity distribution, absolute wavefront error.O t h e r a c c e s s o r i e s o r f e a t u r e s c a n a l s o b e c u s t o m i z e d .F o r d e t a i l s , r e f e r t o t h e S y s t e m C o n s t r u c t i o n G u i d e .