ModuLab XM ECS - Brochure

electrochemical systemthe difference the difference ModuLab® XM ECS is an Xtreme Measurement electrochemical test system that is capable of measuring micro-ohm impedance cells (latest generation batteries and fuel cells, for example), while able to accurately characterize corrosion coatings at the other extreme. The system uses a unique AC calibration method that ensures ultimate accuracy in all cases. Each system is independently calibrated, ensuring the accuracy of your results. The system makes use of ultra-fast sample rate digital electronics to provide:• Smooth analog waveforms that are applied in all option configurations • High-speed pulse and measurement capability (for GSM/CDMA cell phone, pulse charge/discharge, and pulse voltammetry profiles)• Wide range of techniques including CV, CC-CV charge / discharge, Square-Wave Voltammetry, Differential Pulse Voltammetry, Linear Sweep Voltammetry, and the equivalent Potentiometry techniques• The smoothest AC waveforms delivering highest accuracy AC measurement performance (40x oversampled FRA) – includes impedance, admittance, permittivity / capacitance, electrical modulus, Mott-Schottky, plus many more.Anode/Cathode/Stack TestingMarket leading impedance analysisWidest voltage and current range availableAnode/Cathode and Stack TestingModuLab XM ECS makes use of a range of high-quality performance modules including power boosters, high voltage modules and differential voltage auxiliary inputs, to provide the most advanced characterization for the latest generation of ultra-low impedance energy devices. XM is able to measure the time domain and impedance properties of cell anodes/cathodes as well as individual cells in a stack (even for high voltage stacks at up to 100 V). XM’s high-accuracy measurements enable detection of bad cells well in advance of actual cell failure, saving time and thereby increasing test throughput and profitability.These example low-noise measurements are taken from a stack of Li-Ion cells, and show the impedance of the overall stack and of individual cells in the stack.The ModuLab XM system has two ‘intelligent’ Control Modules: • XM PSTAT 1 MS/s for time domain control• XM FRA 1MHz for AC measurementsIn addition there are several Slave Modules that amplify the signals produced by the Control Modules to provide high voltage/current polarization waveforms to the sample, and provide amplified/attenuated high resolution signals back to the control modules: • XM HV100 / HV30 – High voltage options (100 V / 30 V)• XM FEMTO AMMETER - Low current measurement option• XM BOOSTER 2A – High current option (2 amps)Xtreme MeasurementControl and Slave ModulesUltra Low ImpedanceThe ModuLab XM ECS is able to make very accurate, extreme low impedance measurements in the micro-ohm region using a wide range of internal and external power boosters. These example plots show the quality of 10 µohm and 100 µohm data that is available from the system. ModuLab XM may be configured as a single or multichannel system depending on which slave options are needed. In multichannel configurations, each channel can be independently controlled from separate PCs, allowing tests on multiple samples to be run in parallel by separate researchers. It is also possible to configure in the same chassis, groups of modules from ModuLab XM ECS and from the XM MTS Materials Test System (refer to the separate brochure). A typical application is where XM MTS modules characterize high impedance SOFC (Solid Oxide Fuel Cell) ionic membrane materials, while XM ECS modules test the complete fuel cells.All modules are ‘plug and play’ allowing the user to add modules easily, without returning the system to service. Once additional modules or channels have been installed, the software recognizes the modules and enables them for use in future experiments.The software provides powerful automatic sequencing of time domain and AC techniques and provides a wide range of data analysis facilities including Tafel, and equivalent circuit fitting functions. This powerful combination of hardware and software functionality adds to the XM difference…System and SoftwareAC measurements include impedance, capacitance, AC Voltammetry/Potentiometry/Mott-Schottky (with stepped or smoothly ramped DC)Market leading accuracy, speed and repeatabilityXMMulti-sine / Fast Fourier Transform (FFT) Analysis • AC tests include impedance, capacitance, and AC Voltammetry / Potentiometry / Mott -Schottky • Faster measurements across the whole frequency range saves test time and minimizes errors for time-variant cellsHarmonic / Intermodulation Analysis • To investigate cell linearity and distortionXM PSTAT 1 Ms/s makes use of the latest high technology hardware for accurate waveform generation and fast data acquisition. Fast auto-sequencing between CV, pulse and all types of potentiostatic/galvanostatic techniquesPotentiostat /GalvanostatMeasurements of highest conductivity / highest impedance cells are available by appropriate choice of ‘plug and play’ option modulesNo matter which option modules are used, ModuLab XM always provides smooth voltage / current ramp waveforms that are essential for many research applications using its ultrafast sampling waveform generatorFrequency Response AnalyzerXM FRA 1 MHz / 300 KHz are the most versatile Frequency Response Analyzers available today, and are fully compatible with all XM slave modules for high voltage, high/low current, and impedance measurements of anodes/cathodes and complete cells in a battery/fuel cell stack.control modulesAuxiliary Voltage InputsStandard on XM HV modules and are optional on the XM PSTAT control moduleFour differential auxiliary voltage inputs provide synchronized time-domain and impedance testing of cell anodes/cathodes and cells in a stack (12 terminal measurement)Synchronized measurement from pH, pressure, light sensors and other transducersSingle sine correlationXMHigh VoltageOptionsProvides applied cell polarization and compliance at up to 100 V or 30 VPhotoEchemOptionFor extremely accurate time-domain and impedance tests of ultra-low impedance cellsCan be used with XM HV100/HV30 for high voltage / high current testsExternal boosters up to 50 V / 25 A may also be added using XM PSTAT or XM HV100/XM HV30 depending on voltage range requirementsRange of Frequency and Time Domain Measurement techniques including IMPS, IMVS, Impedance, PhotoVoltage Decay, Charge Extraction techniques, I-V‘Auto’ analysis of data enabled for calculation of effective Diffusion coefficients and Electron LifetimesXtreme MeasurementXM BOOSTER 2A and external boosters extend the system’s impedance measurement resolution enabling tests on ultra-low impedance micro-ohm cells.slave modulesXM HV 100 / 30 high voltage amplifier options extend the XM PSTAT’s voltage range to 100 V/30 V for testing fuel cell stacks, battery stacks or other high voltage cells:Low CurrentOptionsLow current amplifier option that extends current measurement resolution to sub fAAvailable for time domain and impedance (with FRA)Combined with XM 100V option provides amazing impedance range Power BoosterOptionsDye-Sensitized Solar Cells (DSSC) - Optical BenchModuLab XM DSSC is a fully integrated photoelectrochemical measurement system designed for the characterization of Dye-Sensitzed Solar Cells (refer to separate brochure for more details). • Range of Frequency and Time domain Measurement techniques including IMPS, IMVS, Impedance, PhotoVoltage Decay, Charge Extraction Techniques, I-V• ‘Auto’ analysis of data enabled for calculation of effective diffusion coefficients and electron lifetimes at one click of a buttonA wide range of accessories are available for use with the ModuLab XM ECS, including:AccessoriesHigh Power BoostersModuLab XM is compatible with power boosters that are designed to extend its range of operation for testing extreme low impedance (<100 µW) batteries, fuel cells, and supercapacitors.• Floating design - enables tests on ground cells• Time domain and impedance tests on short stack fuel cells and multi channel batteries - including individual cells within a stack• Choice of booster models with up to 50 V / 25 A range and 6 V / 100 A • 100 kHz impedance measurement bandwidth for SOFC and other high frequency applicationsCorrosion CellThe cell permits a series of metal specimens and liquid environments to be tested quickly and uniformly. Most of the common electrochemical techniques for corrosion testing can be employed under aggressive conditions (except for HF) and at ambient or elevated temperatures.Tait CellThe Tait Cell was developed to address coatings/corrosion studies on flat specimens where the electrolyte under study cannot support a standard reference electrode. The cell was developed to accept a wide range of working electrode shapes and sizes eliminating the need for machining or special mechanical preparation of the sample.Flat CellThe practical design of the Flat Cell makes it simple to use for corrosion and/or coatings research. It can accommodate a wide range of electrode sizes, eliminating the need for machining or special mechanical procedures. Xtreme MeasurementGeneralControl ModulePotentiostatSlave ModulesHigh Voltage Low Current Internal BoosterXM PSTAT 1MS/s XM HV100/HV30 XM FEMTO AMMETER XM BOOSTER 2ASlots taken 1 slot 1 slot 1 slot 2 slotsCell connections 2, 3, or 4 terminal 2, 3, or 4 terminal 2, 3, or 4 terminal 2, 3, or 4 terminalInstrument Connections CE, WE, RE, LO CE, WE, RE, LO WE, LO CE, WEFloating measurements yes yes yes yesImpedance measurement bandwidth 1 MHz (via FRA) 1 MHz (via FRA) 1 MHz (via FRA) 1 MHz (via FRA)Maximum ADC sample rate 1 MS/s N/A N/A N/ASmooth scan generator 64 MS/s interpolatedand filteredN/A N/A N/AMaximum time record Unlimited N/A N/A N/ADC scan rate (potentiostatic) 1.6 MV/s to 1 µV/s1 10 MV/s to 1 µV/s1 N/A 1.6 MV/s to 1 µV/s1DC scan rate (galvanostatic) 60 kA/s to 200 µA/s1 10 kA/s to 200 µA/s1 N/A 400 kA/s to 200 µA/s1Minimum pulse duration 1 µs N/A N/A N/AIR compensation yes N/A N/A N/ACounter Electrode (CE) XM PSTAT 1MS/s XM HV100/HV30 XM FEMTO AMMETER XM BOOSTER 2AVoltage polarization range ±8 V ±100 V / ±30 V N/A ±20 V2Current polarization range ±300 mA ±100 mA / ±200 mA N/A ±2 AMaximum compliance (CE vs. LO) ±8 V ±100 V / ±30 V N/A ±20 V2Bandwidth (decade steps) 1 MHz to 10 Hz 1 MHz to 10 Hz N/A 1 MHz to 10 HzPolarization V/I error (setting+range) 0.1% + 0.1% N/A N/A N/ASlew rate >10 V/µs >10 V/µs N/A >10 V/µsReference Inputs (RE) XM PSTAT 1MS/s XM HV100/HV30 XM FEMTO AMMETER XM BOOSTER 2AConnections Differential input Differential input PSTAT or HV PSTAT or HVCable Shields Driven / Ground3 Driven / Ground3 N/A N/AMaximum voltage Measurement ±8 V ±100 V / ±30 V N/A N/ARanges 8 V to 3 mV 100 V to 3.75 mV N/A N/AAccuracy (reading % + range % + offset) 0.1%+0.05%+100 µV 0.1%+0.05%+100 µV N/A N/AMaximum resolution 1 µV 1.25 µV N/A N/AInput impedance >100 GW, <28 pF3 >100 GW, <28 pF3 N/A N/AInput bias current <10 pA <10 pA N/A N/AWorking Electrode (WE) XM PSTAT 1MS/s XM HV100/HV30 XM FEMTO AMMETER XM BOOSTER 2AMaximum current ±300 mA ±100 mA / ±200 mA ±300 mA ±2 ARanges 300 mA to 30 nA 300 mA to 30 nA 300 mA to 30 pA 3 A to 30 nAAccuracy (reading % + range % + offset) 0.1% + 0.05%+ 30 fA 0.1% + 0.05%+ 30 fA 0.1% + 0.05%+ 30 fA 0.1% + 0.05%+ 30 fAMaximum resolution 1.5 pA 1.5 pA 1.5 fA 1.5 pACompliance voltage range (floating) ±8 V ±100 V / ±30 V ±100 V ±20 V2Auxiliary electrodes (A, B, C, D) XM PSTAT 1MS/s XM HV100/HV30 XM FEMTO AMMETER XM BOOSTER 2AConnections 4 (each differential) 4 (each differential) PSTAT or HV PSTAT or HVSpecification Same as RE above3 Same as RE above3 N/A N/ADC Measurement Sychronized to RE Synchronized to RE N/A N/AImpedance measurement bandwidth 1 MHz (via FRA) 1 MHz (via FRA) N/A N/ASpecifications1 Highest scan rates require external data acquisition card, internal ADCs may be used up to 25 kV/s 2 20 V with HV option fitted, 8 V with core card only3 Driven shields used in 3-terminal mode, grounded for 4-terminal. Capacitance spec. applies to 3-t mode. Aux. electrodes use driven shields.4 The WE Femto Ammeter “reading %” accuracy term is 0.2% for 300 pA range, 2% for 30 pA range and 5% for 3 pA rangeUSA801 South Illinois AvenueOak RidgeTN, 37831-0895 USATel: (865) 425-1289Fax: (865) 481-2410EuropeUnit 1 Armstrong MallSouthwood Business ParkFarnboroughHampshire GU14 ONR UKTel: +44 (0) 1252 556800Fax: +44 (0) 1252 556899Visit our website for a complete list of our global offices and authorized agentssolartron.info@ametek.com www.solartronanalytical.com0714AFrequency Response Analyzer XM FRA 1MHz/300kHzMaximum sample rate 40 MS/sFrequency range - FRA 1 MHz - FRA 300 kHz10 µHz to 1 MHz10 µHz to 300 kHzFrequency resolution 1 in 65,000,000Frequency error ±100 ppmMinimum ? time per measurement(single sine, FFT or harmonic)10 msSignal Output XM FRA 1MHz/300kHzWaveform Single sine, multi-sineSingle Sine Linear / logarithmicMulti-sine / harmonic frequencies All or selectedAnalysis channels XM FRA 1MHz/300kHzAccuracy (ratio) ±0.1%, ±0.1°Anti-alias, digital filters, DC bias reject AutomaticAnalysis channels RE, WE, Aux A/B/C/DAnalysis modes: Single sine, FFT, harmonicDC Bias rejection AutomaticMFRA Specifications System Impedance AccuracyImpedance accuracy specification for PSTAT, Femto Ammeter and 2A Booster combined. PSTAT Impedance AccuracyMFRA Accuracy*High voltage option modules provide up to 10X higher impedance than shown*External high power boosters extend accuracy to 1 µW *3T connections for impedance >1 kW, 4T connections otherwise*Impedance <1 W , measured using 4T connection and gstat mode*Faraday cage and suitable screening recommendedImpedance accuracy specification for PSTAT operating stand alone*High voltage option modules provide up to 10X higher impedance than shown*External high power boosters extend accuracy to 1 µW *3T connections for impedance >1 kW, 4T connections otherwise*Impedance <1 W , measured using 4T connection and gstat mode*Faraday cage and suitable screening recommended