Nano SpotLight - High-Efficiency Nano-Particle Sampler Brochure

Our high-efficiency nano-particle sampler, Nano SpotLight, collects a focused 1-mm “spot” deposit of particles as small as 5 nm on a dry substrate such as a test silica wafer. The sample is analyzed off-line using powerful scanning electron microscopy and energy dispersive X-ray analysis (SEM/EDX). The analysis characterizes the quantity, size, shape and chemical composition of the particles. Visualizing the particles and knowing their chemical makeup allows the process engineer to rapidly identify the contaminant source and take corrective action. The sampling can be done in less than 24 hours, sometimes in just a few minutes if there is a high contamination excursion.