Single & Multi-Element Silicon Drift Detectors (SDD) for Beam-Line and Research Applications - Brochure

Materials may be studied using a number of advanced X-ray Fluorescence techniques made possible using intense sources of monochromatic radiation, such as are available from electron storage rings known as Synchrotrons. Information such as elemental and chemical composition and speciation of chemical bonds may be determined at micrometer and even nanometer scales using modern synchrotrons and techniques employing X-Ray Absorption Spectroscopy (XAS) methods.