Vertex Brochure

TMHigh-lhroughputUariable AngleSpccular ReflectanceApplicationsO Variable thickness solid sarnplesO Coatings on metals and plasticsO Epitaxial la_vers ir-r Si wafersO Surlact--treatedmetalsa Lubricatcd surlacesa Robust and lragile samplesthe StandardO 5 - 8i' angle of incidence rvithl" resolttlit,na Factory-calibratetl reference dialEasy user-calibration and position lockSimultaneous rotation of sample andmirror plar-res for constant pathlengthI(inematically nounted for stabilitl'I(Br input/or,rtput conditioning lenses50% throughput provides excellentsignal to r-roise resolutionEasy interlace with most speLtromrtersThe non-destructive charactc'rization clf metal and plastic coatings, epitaxiallirl'ers, snrface treatments, fihns, pow,clers, and other materials is LrecomingincrcasingJy important as researchers and process chentists seek to developnew products for business and industry. In addition, muitiple analysistechniqucs are required to enslrre the cliscriminate identification ol rnaterialsthat vary onil,slightly iron one pltvsico-cher-nical iorntulation to another.Since mar-ry nerv solids are now used in micron or sutr-tnicron thicknesses,tcchniques are sought which can characterize property differences at thesub-microu scale. \\\\'ariable .rnsle snc(rrlar reflt,,'rion measureme nts offera leading solution.THF-lSllecr-rlar reflection is a mirror-like re-flc'ction fronr the sr.Lrface of a sample.htfrared radiation is directed onto thesttrface o{ a sample. The angle ofreflection (R) is eqtr.rl to the angle ofincidence (I); see Figrrre l. The amor.tnloi radiation reflected is a function of tl.resample's index of lefraction, absorptionproperties, sur{ace roughness, and theangle of incidence of the infrared radi-a tic'rt t.aoooaooaaolhe CptionsGold-coated mirrorsPurge enclosureMirrors r.vith UV coatingsWire grid polarizerThe specular radi.:tior-r process collects onll'the ratlialion rellected ofl thrsample's surface that is closest to the beam. When specular reflectance isnreasured at or near normal incidence (the usual case), the reflected energyis small-onll' 5 - 10%-for nrost organic materials in those regions whercthe material is non-"rbsorbing. However, in regions oi strong absorption,the reflected energy is much greater. The re{lected radiation intensity dataare cltten quite diffe rent from the transmission spectra, since derivativeslraped bands are the result of the superposition of the nrlrmal extinctionct>eflicient spectrllltr and the refractir.'e index dispersion.Strongly absorbing materials, sr-rch as silicates, intensel,v reflect racliationover a specific energl' range, producing uniqr-re spectral leatures calledreststrahlert bands. Manl' minerals ancl glasses are characterized by thesespectra.The increased usefulness of the specular reflection technique is a functionoI the development of computer softn'are for fast I(ramers-I(ronig transformcalcuiations. Now, specular reflection c'lata that are difficr,rlt to interpret can[-rc' quickly transiornred into readill il]terpreted transnrission-iike spectraalmost instantaneorrsly.The Vertexlv -Variable Angle Specular Reflectance Accessory- by CICPhotonics has been designed to perurit measrlrements ol the reflectanceol a solid sample material while varying the angle of incidence (AOI) ofUC PhotonicsFII{DI THE PAthe source illumination. This is acccrnrplished h1' simultaneousll, rotatingthe sanrple and a lixed nrirror aboul a point coincident \\\\l,ith both planes.The AOI on the sample varies inverscly r'vlth that on thc ruirror; the nelrcsult is rninimal translation of thc lream and conslant pathlength.The range ol rotation is atrrproxinratel\\\\, 80", which produccs angles ofirtcitlence from approxinrately 5" to 85". At the ertrcrncs ol this ranqc.clipping by both the leading and trailing surfact's results in only a fewpercent of the beam actually passing through the s) stcnr. limiting thrlrsability ol the system.The device provides 1or bolding a s.rnrplc with a single, spring-loadcdclamp. The clamp ma1'bc rotated 1o apply pressure near thr cente r of thesample or, if the sample is dclicate, the clarnp n-Lay be rotated to one sitlerrhere the force of the clarnp is opposed by a sullporting clanrp lseeDiagram). Orce aflixed, tbe samplc n)a)/ then be positioned by rot.rtingthc knurled stainless atljustment n'heel on thc rear of the r.rnit. The snrallthumb scre\\\\v on top of the nnit locks the position oncc it is esrablished.A referencc dial is attachetl to the adjtrstment rvhcel and indicates, byalignnrent nith the top cclgc of the accessoq'. tire angle of incidence olrthe sarnple lr,ithin one-tlegree precision. The clial is faclon -calibratedbefore shiprncnt but may easily be adjusted in order to recalitrrate if desired.The Verlexrv cornes equipped rvith ItIlr conditioning lenses for FT-IRspectrometers rvith an {/5 source bearl; no lenscs are reqrrired lor thecollinratcrl beJllr) of UV/VIS spectrorle ters. The standarcl FT-IR mirrorsare non-o\\\\ercoatecl alulltinlLnr rnirrcxs. Thc UV/VIS versiorr rrses dielectr-ic-ove rcoated allrminum nrirrors. AIso irrcludecl ate adiustrnetrt lools. arelcrcnce mirror, and a shipping case.Fj3c... ... ....... r4B 100..,..... ... .. t48200Go d C.rate,i l'l rror:Purge EnclcsureWre C o Pol . zer',..t48t 0.. 4B 50.. i48 | 60Other Related CIC PhotonicsSampling AccessoriesThe Ero orer lorizonia ATR Accessory... ..............428 100The Insrder FT R Err ssron Accessory. .......098 00The Fresne ATR Hor zorta ATR, Af'lT RlSo ds ....... .,.... ................ 578200The f'l cro Pr^es: ['1 croscope Compres: on Stage... ..30B (J0The Spec-.1-5 f- xed (,15') Ang e Specu ar Reflectance ,....... ...35B 100The Roadrurrner Difiuse Re{lectance ..............,........... | 5B | 00The NIC ATR Researr:h 'ertica ATR for N co et 28B000The Scout l5-crr D rect PassTr ansm ss on Gas Ce l. ...,,,..388 OOCIC Plrotottics, Irrc.t+f.5+Bre*ebe+t ParJuX,NLA buquerque, NM 8tt€7*'Corporate Headquar-ters: 505i343-9500Sales: €€e*€€+3€9-F=ax: -5OS1343-9:O&l-Ie' er {-r-ril: €b@e+€F€€+-Worid W de Web: wmr.cicp.conrffiCI9 lltotonicsUC Photonics